Yang Yanfei, Cheng Guangjun, Mende Patrick, Calizo Irene G, Feenstra Randall M, Chuang Chiashain, Liu Chieh-Wen, Liu Chieh-I, Jones George R, Hight Walker Angela R, Elmquist Randolph E
National Institute of Standards and Technology, Gaithersburg, MD 20899-8171, USA.
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213-3890, USA.
Carbon N Y. 2017 May;115:229-236. doi: 10.1016/j.carbon.2016.12.087. Epub 2016 Dec 30.
Quantized magnetotransport is observed in 5.6 × 5.6 mm epitaxial graphene devices, grown using highly constrained sublimation on the Si-face of SiC(0001) at high temperature (1900 °C). The precise quantized Hall resistance of [Formula: see text] is maintained up to record level of critical current = 0.72 mA at = 3.1 K and 9 T in a device where Raman microscopy reveals low and homogeneous strain. Adsorption-induced molecular doping in a second device reduced the carrier concentration close to the Dirac point ( ≈ 10 cm), where mobility of 18760 cm/V is measured over an area of 10 mm. Atomic force, confocal optical, and Raman microscopies are used to characterize the large-scale devices, and reveal improved SiC terrace topography and the structure of the graphene layer. Our results show that the structural uniformity of epitaxial graphene produced by face-to-graphite processing contributes to millimeter-scale transport homogeneity, and will prove useful for scientific and commercial applications.
在通过高温(1900°C)在SiC(0001)的Si面上采用高度受限升华法生长的5.6×5.6毫米外延石墨烯器件中观察到了量子化磁输运。在一个拉曼显微镜显示应变低且均匀的器件中,高达0.72 mA的临界电流记录水平(在3.1 K和9 T时)下,[公式:见正文]的精确量子化霍尔电阻得以保持。在第二个器件中,吸附诱导的分子掺杂降低了接近狄拉克点(≈10厘米)的载流子浓度,在该器件中,在10毫米的面积上测量到迁移率为18760厘米²/伏。原子力显微镜、共焦光学显微镜和拉曼显微镜用于表征大规模器件,并揭示了改进的SiC台面形貌和石墨烯层的结构。我们的结果表明,通过面到石墨工艺生产的外延石墨烯的结构均匀性有助于毫米级的输运均匀性,并将被证明对科学和商业应用有用。