University of Novi Sad, Faculty of Medicine, School of Dentistry, Hajduk Veljkova 3, 21000 Novi Sad, Serbia.
Bosn J Basic Med Sci. 2013 Feb;13(1):34-43. doi: 10.17305/bjbms.2013.2417.
The aim of this study was to determine surface roughness and topography of polished dental resin-based nanocomposites. Four representative dental resin-based nanocomposites were tested in the study: two nanohybrids (Filtek Z550 and Tetric EvoCeram) and two nanofilled (Filtek Ultimate Body and Filtek Ultimate Translucent); and two reference materials: one microfilled (Gradia Direct) and one microhybrid (Filtek Z250). Polymerized cylindrical specimens (4 mm x 2 mm) were polished with multi-step polishing system- Super Snap. Immediately after the polishing, topography of each specimen was examined by Veeco di CP-II Atomic Force Microscope. Specimen's surface has been scanned in 6 points in contact mode with CONT20A-CP tips. 1 Hz scan rate and 256 × 256 resolution were used to obtain topography on a 90 µm × 90 µm scanning area. Measured topography data were processed by Image Processing and Data Analysis v2.1.15 software. Following parameters were compared among specimens: average roughness and maximum peak-to-valley distance. All of the tested materials had similar average surface roughness after finishing and polishing procedure. The lowest values occurred in the material Filtek Ultimate Body, and the highest in the Filtek Z550. When interpreting maximum peak-to-valley distance the larger differences in values (up to 100%) occurred in Filtek Z550, Filtek Z250 and Filtek Ultimate Body, which is a result of the deep polishing channels and tracks. Type, size, distribution of fillers and filler loading in tested materials, didn't influence average roughness values, but had an impact on maximum peak-to-valley distance values.
本研究旨在确定抛光牙科树脂基纳米复合材料的表面粗糙度和形貌。本研究测试了四种具有代表性的牙科树脂基纳米复合材料:两种纳米杂化材料(Filtek Z550 和 Tetric EvoCeram)和两种纳米填充材料(Filtek Ultimate Body 和 Filtek Ultimate Translucent);以及两种参考材料:一种微填充材料(Gradia Direct)和一种微混合材料(Filtek Z250)。聚合的圆柱形试件(4mm×2mm)用多步抛光系统-Super Snap 进行抛光。抛光后,立即使用 Veeco di CP-II 原子力显微镜检查每个试件的形貌。以接触模式用 CONT20A-CP 探头在 6 个点扫描试件表面。使用 1Hz 的扫描速率和 256×256 的分辨率在 90μm×90μm 的扫描区域上获得形貌。使用图像处理和数据分析 v2.1.15 软件处理测量的形貌数据。比较了试件之间的以下参数:平均粗糙度和最大峰谷距离。所有经过修整和抛光处理的测试材料的表面粗糙度均相似。Filtek Ultimate Body 的值最低,Filtek Z550 的值最高。当解释最大峰谷距离时,Filtek Z550、Filtek Z250 和 Filtek Ultimate Body 的值差异最大(高达 100%),这是由于存在深的抛光通道和轨迹。测试材料中的填料类型、尺寸、分布和填料负载对平均粗糙度值没有影响,但对最大峰谷距离值有影响。