School of Electrical and Electronic Engineering, 50 Yonsei-ro, Seodaemun-gu, Yonsei University, Seoul 120-749, Korea.
ACS Appl Mater Interfaces. 2013 May;5(9):3565-71. doi: 10.1021/am302722h. Epub 2013 Apr 16.
We investigated the formation of ultraviolet (UV)-assisted directly patternable solution-processed oxide semiconductor films and successfully fabricated thin-film transistors (TFTs) based on these films. An InGaZnO (IGZO) solution that was modified chemically with benzoylacetone (BzAc), whose chelate rings decomposed via a π-π* transition as result of UV irradiation, was used for the direct patterning. A TFT was fabricated using the directly patterned IGZO film, and it had better electrical characteristics than those of conventional photoresist (PR)-patterned TFTs. In addition, the nitric acid (HNO3) and acetylacetone (AcAc) modified In2O3 (NAc-In2O3) solution exhibited both strong UV absorption and high exothermic reaction. This method not only resulted in the formation of a low-energy path because of the combustion of the chemically modified metal-oxide solution but also allowed for photoreaction-induced direct patterning at low temperatures.
我们研究了紫外(UV)辅助的直接可图案化溶液处理氧化物半导体薄膜的形成,并成功地基于这些薄膜制造了薄膜晶体管(TFT)。用化学方法用苯甲酰丙酮(BzAc)修饰的 InGaZnO(IGZO)溶液,其螯合环由于 UV 照射而通过π-π*跃迁分解,用于直接图案化。使用直接图案化的 IGZO 薄膜制造了 TFT,它具有比传统光刻胶(PR)图案化 TFT 更好的电特性。此外,用硝酸(HNO3)和乙酰丙酮(AcAc)修饰的氧化铟(NAc-In2O3)溶液表现出强烈的紫外吸收和高放热反应。该方法不仅由于化学改性金属氧化物溶液的燃烧而形成了低能量路径,而且还允许在低温下进行光反应诱导的直接图案化。