Department of Ophthalmology, Korea University College of Medicine, Seoul, South Korea.
Am J Ophthalmol. 2013 Jul;156(1):157-164.e2. doi: 10.1016/j.ajo.2013.02.016. Epub 2013 Apr 17.
To evaluate the correlation between changes in fundus autofluorescence (AF) measured using 2 different sources (near-infrared fundus autofluorescence from melanin and short-wavelength fundus autofluorescence from lipofuscin) with changes in spectral-domain optical coherence tomography (SD OCT) and fluorescein angiography in resolved central serous chorioretinopathy (CSC).
Retrospective, observational case study.
A total of 91 eyes from 86 patients with a history of resolved CSC and abnormal AF imaging findings were included. In addition to AF, patients were assessed by means of SD OCT and fluorescein angiography. Outer retinal layer alterations in OCT images and abnormalities in fluorescein angiography were analyzed and correlated with the corresponding AF data.
All eyes with abnormal near-infrared AF showed a hyperfluorescent angiography window defect in the corresponding area. There was a significant association between the OCT and short-wavelength AF findings. An abnormal short-wavelength AF signal was significantly associated with loss of the ellipsoid portion of the inner segments (EPIS, previously known as the junction between the inner and outer segments of the photoreceptors) on SD OCT (χ(2) test; P < .0001). Near-infrared AF could not predict the status of EPIS without the short-wavelength AF image.
Outer retinal layer changes in OCT images can be predicted by analyzing both short-wavelength AF and near-infrared AF images. Abnormal changes in the short-wavelength AF image were predictive of EPIS damage.
评估使用 2 种不同来源(黑色素的近红外眼底自发荧光和脂褐素的短波长眼底自发荧光)测量的眼底自发荧光(AF)变化与 resolved central serous chorioretinopathy(CSC)的光谱域光相干断层扫描(SD OCT)和荧光素血管造影变化之间的相关性。
回顾性、观察性病例研究。
共纳入 86 例 resolved CSC 病史且存在异常 AF 成像结果的 91 只眼。除了 AF,还通过 SD OCT 和荧光素血管造影对患者进行评估。分析 OCT 图像中外层视网膜变化和荧光素血管造影中的异常,并与相应的 AF 数据相关联。
所有异常近红外 AF 的眼均在相应区域显示出荧光造影窗缺损的强荧光。OCT 和短波长 AF 结果之间存在显著相关性。异常短波长 AF 信号与 SD OCT 上内节(EPIS,以前称为光感受器内外节交界处)的椭圆部分(EPIS)损失显著相关(卡方检验;P<0.0001)。没有短波长 AF 图像,近红外 AF 无法预测 EPIS 的状态。
可以通过分析短波长 AF 和近红外 AF 图像来预测 OCT 图像中外层视网膜层的变化。短波长 AF 图像的异常变化可预测 EPIS 损伤。