National Institute for Material Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan.
Sci Rep. 2013;3:2368. doi: 10.1038/srep02368.
The typical photodetectors can only detect one specific optical spectral band, such as InGaAs and graphene-PbS quantum dots for near-infrared (NIR) light detection, CdS and Si for visible light detection, and ZnO and III-nitrides for UV light detection. So far, none of the developed photodetector can achieve the multicolor detection with arbitrary spectral selectivity, high sensitivity, high speed, high signal-to-noise ratio, high stability, and simplicity (called 6S requirements). Here, we propose a universal strategy to develop multicolor photodetectors with arbitrary spectral selectivity by integrating various semiconductor nanostructures on a wide-bandgap semiconductor or an insulator substrate. Because the photoresponse of each spectral band is determined by each semiconductor nanostructure or the semiconductor substrate, multicolor detection satisfying 6S requirements can be readily satisfied by selecting the right semiconductors.
典型的光电探测器只能检测一个特定的光光谱带,例如用于近红外 (NIR) 光检测的 InGaAs 和石墨烯-PbS 量子点、用于可见光检测的 CdS 和 Si、以及用于紫外光检测的 ZnO 和 III 族氮化物。到目前为止,还没有一种开发的光电探测器能够实现具有任意光谱选择性、高灵敏度、高速、高信噪比、高稳定性和简单性(称为 6S 要求)的多色检测。在这里,我们提出了一种通用策略,通过在宽带隙半导体或绝缘体衬底上集成各种半导体纳米结构,来开发具有任意光谱选择性的多色光电探测器。因为每个光谱带的光响应由每个半导体纳米结构或半导体衬底决定,所以通过选择合适的半导体,很容易满足满足 6S 要求的多色检测。