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基于单个单晶 GeSe 纳米片的近红外肖特基光电探测器。

NIR Schottky photodetectors based on individual single-crystalline GeSe nanosheet.

机构信息

Department of Physics, National University of Singapore (NUS) , 2 Science Drive 3, Singapore 117542.

出版信息

ACS Appl Mater Interfaces. 2013 Oct 9;5(19):9594-604. doi: 10.1021/am402550s. Epub 2013 Sep 26.

Abstract

We have synthesized high-quality, micrometer-sized, single-crystal GeSe nanosheets using vapor transport and deposition techniques. Photoresponse is investigated based on mechanically exfoliated GeSe nanosheet combined with Au contacts under a global laser irradiation scheme. The nonlinearship, asymmetric, and unsaturated characteristics of the I-V curves reveal that two uneven back-to-back Schottky contacts are formed. First-principles calculations indicate that the occurrence of defects-induced in-gap defective states, which are responsible for the slow decay of the current in the OFF state and for the weak light intensity dependence of photocurrent. The Schottky photodetector exhibits a marked photoresponse to NIR light illumination (maximum photoconductive gain ∼5.3 × 10(2) % at 4 V) at a wavelength of 808 nm. The significant photoresponse and good responsitivity (∼3.5 A W(-1)) suggests its potential applications as photodetectors.

摘要

我们使用气相输运和沉积技术合成了高质量的、微米级的单晶 GeSe 纳米片。在全局激光辐照方案下,基于机械剥落的 GeSe 纳米片与 Au 接触,研究了光响应。I-V 曲线的非线性、不对称和不饱和特性表明形成了两个不均匀的背靠背肖特基接触。第一性原理计算表明,缺陷诱导的带隙内缺陷态的出现是导致电流在关态缓慢衰减和光电流对光强弱依赖的原因。肖特基光电探测器在 808nm 波长的近红外光照射下表现出显著的光响应(最大光电导增益约为 4V 时为 5.3×10(2) %)。显著的光响应和良好的响应度(约 3.5A W(-1))表明其在光电探测器方面的潜在应用。

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