School of Electrical and Electronics Engineering and §Department of Materials Science and Engineering, Yonsei University , Seoul 120-749, Korea.
ACS Nano. 2013 Dec 23;7(12):11333-40. doi: 10.1021/nn405194e. Epub 2013 Nov 27.
The synthesis of atomically thin transition-metal disulfides (MS2) with layer controllability and large-area uniformity is an essential requirement for their application in electronic and optical devices. In this work, we describe a process for the synthesis of WS2 nanosheets through the sulfurization of an atomic layer deposition (ALD) WO3 film with systematic layer controllability and wafer-level uniformity. The X-ray photoemission spectroscopy, Raman, and photoluminescence measurements exhibit that the ALD-based WS2 nanosheets have good stoichiometry, clear Raman shift, and bandgap dependence as a function of the number of layers. The electron mobility of the monolayer WS2 measured using a field-effect transistor (FET) with a high-k dielectric gate insulator is shown to be better than that of CVD-grown WS2, and the subthreshold swing is comparable to that of an exfoliated MoS2 FET device. Moreover, by utilizing the high conformality of the ALD process, we have developed a process for the fabrication of WS2 nanotubes.
原子层沉积(ALD)WO3 薄膜的硫化过程可合成具有层可控性和大面积均匀性的原子层薄过渡金属二硫化物(MS2),这是将其应用于电子和光学器件的基本要求。在这项工作中,我们描述了一种通过原子层沉积(ALD)WO3 薄膜的硫化来合成 WS2 纳米片的方法,该方法具有系统的层可控性和晶圆级均匀性。X 射线光电子能谱、拉曼和光致发光测量表明,ALD 基 WS2 纳米片具有良好的化学计量比、清晰的拉曼位移和带隙依赖性,这与层数有关。使用具有高 k 介电栅极绝缘体的场效应晶体管(FET)测量的单层 WS2 的电子迁移率优于 CVD 生长的 WS2,亚阈值摆幅可与剥离的 MoS2 FET 器件相媲美。此外,通过利用 ALD 工艺的高保形性,我们开发了一种 WS2 纳米管的制造工艺。