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表面增强拉曼散射热点的超分辨成像。

Super-resolution imaging of SERS hot spots.

机构信息

Department of Chemistry, University of Texas at Austin, 102 E. 24th St. STOP A5500, Austin, TX 78712, USA.

出版信息

Chem Soc Rev. 2014 Jun 7;43(11):3854-64. doi: 10.1039/c3cs60334b. Epub 2013 Dec 5.

Abstract

Surface-enhanced Raman scattering (SERS) hot spots occur when molecules are positioned near regions of strongly enhanced electromagnetic fields on the surface of nano-featured plasmonic substrates. The emission from the molecule is coupled out into the far field by the plasmon modes of the substrate, but due to the diffraction-limit of light, the properties of this coupled molecule-plasmon emitter cannot be resolved using typical far-field optical microscopy techniques. However, by fitting the emission to a model function such as 2-dimensional Gaussian, the relative position of the emitter can be determined with precision better than 5 nm in a process known as super-resolution imaging. This tutorial review describes the basic principles of super-resolution imaging of SERS hot spots using single molecules to probe local electromagnetic field enhancements. New advances using dipole-based fitting functions and spectrally- and spatially-resolved measurements are described, providing new insight into SERS hot spots and the important roles of both the molecule and the substrate in defining their properties.

摘要

表面增强拉曼散射(SERS)热点是当分子被置于纳米特征等离子体衬底表面上的强电磁场增强区域附近时出现的。分子的发射通过衬底的等离子体模式耦合到远场,但由于光的衍射极限,无法使用典型的远场光学显微镜技术来分辨这种耦合分子-等离子体发射器的性质。然而,通过将发射拟合到模型函数(例如二维高斯函数),可以以优于 5nm 的精度确定发射器的相对位置,这个过程称为超分辨率成像。本教程综述描述了使用单分子探测局部电磁场增强来实现 SERS 热点超分辨率成像的基本原理。描述了使用基于偶极子的拟合函数和光谱及空间分辨测量的新进展,为 SERS 热点以及分子和衬底在定义其性质方面的重要作用提供了新的见解。

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