Li Qiang, Shen Ting-Ting, Cao Yan-Ling, Zhang Kun, Yan Shi-Shen, Tian Yu-Feng, Kang Shi-Shou, Zhao Ming-Wen, Dai You-Yong, Chen Yan-Xue, Liu Guo-Lei, Mei Liang-Mo, Wang Xiao-Lin, Grünberg Peter
School of Physics, National Key Laboratory of Crystal Materials, Shandong University, Jinan, 250100, P. R. China.
Institute of Superconducting and Electrical Materials, Australian Institute of Innovative Materials, University of Wollongong, Wollongong, NSW 2522, Australia.
Sci Rep. 2014 Jan 23;4:3835. doi: 10.1038/srep03835.
The spin memristive devices combining memristance and tunneling magnetoresistance have promising applications in multibit nonvolatile data storage and artificial neuronal computing. However, it is a great challenge for simultaneous realization of large memristance and magnetoresistance in one nanoscale junction, because it is very hard to find a proper spacer layer which not only serves as good insulating layer for tunneling magnetoresistance but also easily switches between high and low resistance states under electrical field. Here we firstly propose to use nanon composite barrier layers of CoO-ZnO to fabricate the spin memristive Co/CoO-ZnO/Co magnetic tunnel junctions. The bipolar resistance switching ratio is high up to 90, and the TMR ratio of the high resistance state gets to 8% at room temperature, which leads to three resistance states. The bipolar resistance switching is explained by the metal-insulator transition of CoO(1-v) layer due to the migration of oxygen ions between CoO(1-v) and ZnO(1-v).
结合忆阻和隧穿磁阻的自旋忆阻器件在多位非易失性数据存储和人工神经计算方面具有广阔的应用前景。然而,在一个纳米级结中同时实现大的忆阻和磁阻是一个巨大的挑战,因为很难找到一个合适的间隔层,它不仅要作为隧穿磁阻的良好绝缘层,而且要在电场作用下容易在高阻态和低阻态之间切换。在此,我们首次提出使用CoO-ZnO纳米复合势垒层来制备自旋忆阻Co/CoO-ZnO/Co磁性隧道结。双极电阻开关比高达90,室温下高阻态的隧穿磁电阻比达到8%,这导致了三种电阻状态。双极电阻开关是由于CoO(1-v)层中氧离子在CoO(1-v)和ZnO(1-v)之间迁移而引起的CoO(1-v)层的金属-绝缘体转变来解释的。