Fukidome Hirokazu, Ide Takayuki, Kawai Yusuke, Shinohara Toshihiro, Nagamura Naoka, Horiba Koji, Kotsugi Masato, Ohkochi Takuo, Kinoshita Toyohiko, Kumighashira Hiroshi, Oshima Masaharu, Suemitsu Maki
1] Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aobaku-ku, Sendai, Miyagi 980-8577, Japan [2] Core Research for Evolutional Science and Technology, Japan Science and Technology Agency, 5-7, Goban-cho, Chiyoda-ku, Tokyo 102-0076, Japan.
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aobaku-ku, Sendai, Miyagi 980-8577, Japan.
Sci Rep. 2014 Jun 6;4:5173. doi: 10.1038/srep05173.
Graphene exhibits unusual electronic properties, caused by a linear band structure near the Dirac point. This band structure is determined by the stacking sequence in graphene multilayers. Here we present a novel method of microscopically controlling the band structure. This is achieved by epitaxy of graphene on 3C-SiC(111) and 3C-SiC(100) thin films grown on a 3D microfabricated Si(100) substrate (3D-GOS (graphene on silicon)) by anisotropic etching, which produces Si(111) microfacets as well as major Si(100) microterraces. We show that tuning of the interface between the graphene and the 3C-SiC microfacets enables microscopic control of stacking and ultimately of the band structure of 3D-GOS, which is typified by the selective emergence of semiconducting and metallic behaviours on the (111) and (100) portions, respectively. The use of 3D-GOS is thus effective in microscopically unlocking various potentials of graphene depending on the application target, such as electronic or photonic devices.
石墨烯呈现出非同寻常的电子特性,这是由狄拉克点附近的线性能带结构引起的。这种能带结构由石墨烯多层膜中的堆叠顺序决定。在此,我们展示了一种微观控制能带结构的新方法。这是通过在经各向异性蚀刻在三维微加工的硅(100)衬底(三维石墨烯/硅(3D-GOS))上生长的3C-SiC(111)和3C-SiC(100)薄膜上外延生长石墨烯来实现的,这种蚀刻会产生Si(111)微面以及主要的Si(100)微平台。我们表明,调节石墨烯与3C-SiC微面之间的界面能够实现对堆叠的微观控制,并最终控制三维石墨烯/硅(3D-GOS)的能带结构,其典型特征是在(111)和(100)部分分别选择性地出现半导体和金属行为。因此,根据应用目标,如电子或光子器件,使用三维石墨烯/硅(3D-GOS)能有效地微观释放石墨烯的各种潜力。