Aghamohammadi Mahdieh, Rödel Reinhold, Zschieschang Ute, Ocal Carmen, Boschker Hans, Weitz R Thomas, Barrena Esther, Klauk Hagen
Max Planck Institute for Solid State Research , Heisenbergstr.1, 70569, Stuttgart, Germany.
Instituto de Ciencia de Materiales de Barcelona (ICMAB-CSIC) , Campus de la UAB, 08193 Bellaterra, Spain.
ACS Appl Mater Interfaces. 2015 Oct 21;7(41):22775-85. doi: 10.1021/acsami.5b02747. Epub 2015 Oct 6.
The mechanisms behind the threshold-voltage shift in organic transistors due to functionalizing of the gate dielectric with self-assembled monolayers (SAMs) are still under debate. We address the mechanisms by which SAMs determine the threshold voltage, by analyzing whether the threshold voltage depends on the gate-dielectric capacitance. We have investigated transistors based on five oxide thicknesses and two SAMs with rather diverse chemical properties, using the benchmark organic semiconductor dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene. Unlike several previous studies, we have found that the dependence of the threshold voltage on the gate-dielectric capacitance is completely different for the two SAMs. In transistors with an alkyl SAM, the threshold voltage does not depend on the gate-dielectric capacitance and is determined mainly by the dipolar character of the SAM, whereas in transistors with a fluoroalkyl SAM the threshold voltages exhibit a linear dependence on the inverse of the gate-dielectric capacitance. Kelvin probe force microscopy measurements indicate this behavior is attributed to an electronic coupling between the fluoroalkyl SAM and the organic semiconductor.
由于用自组装单分子层(SAMs)对栅极电介质进行功能化处理,导致有机晶体管阈值电压偏移的背后机制仍存在争议。我们通过分析阈值电压是否取决于栅极电介质电容,来探讨SAMs决定阈值电压的机制。我们使用基准有机半导体二萘并[2,3-b:2',3'-f]噻吩并[3,2-b]噻吩,研究了基于五种氧化物厚度和两种具有相当不同化学性质的SAMs的晶体管。与之前的几项研究不同,我们发现两种SAMs的阈值电压对栅极电介质电容的依赖性完全不同。在具有烷基SAM的晶体管中,阈值电压不取决于栅极电介质电容,主要由SAM的偶极特性决定,而在具有氟烷基SAM的晶体管中,阈值电压与栅极电介质电容的倒数呈线性关系。开尔文探针力显微镜测量表明,这种行为归因于氟烷基SAM与有机半导体之间的电子耦合。