Singh Arti, Knox Ron E, DePauw R M, Singh A K, Cuthbert R D, Kumar S, Campbell H L
Semiarid Prairie Agricultural Research Center, Agriculture and Agri-Food Canada, Swift Current, SK, S9H 3X2, Canada.
Department of Agronomy, Iowa State University, Ames, IA, 50011, USA.
Theor Appl Genet. 2016 Feb;129(2):243-56. doi: 10.1007/s00122-015-2624-8. Epub 2015 Oct 31.
Breeding for field resistance to common bunt in wheat will need to account for multiple genes and epistatic and QTL by environment interactions. Loci associated with quantitative resistance to common bunt are co-localized with other beneficial traits including plant height and rust resistance.
Common bunt, also known as stinking smut, is caused by seed borne fungi Tilletia tritici (Bjerk.) Wint. [syn. Tilletia caries (DC.) Tul.] and Tilletia laevis Kühn [syn. Tilletia foetida (Wallr.) Liro.]. Common bunt is known to cause grain yield and quality losses in wheat due to bunt ball formation and infestation of the grain. The objectives of this research were to identify and map quantitative trait loci (QTL) for common bunt resistance, to study the epistatic interactions between the identified QTL, and investigate the co-localization of bunt resistance with plant height. A population of 261 doubled haploid lines from the cross Carberry/AC Cadillac and checks were genotyped with polymorphic genome wide microsatellite and DArT(®) markers. The lines were grown in 2011, 2012, and 2013 in separate nurseries for common bunt incidence and height evaluation. AC Cadillac contributed a QTL (QCbt.spa-6D) for common bunt resistance on chromosome 6D at markers XwPt-1695, XwPt-672044, and XwPt-5114. Carberry contributed QTL for bunt resistance on chromosomes 1B (QCbt.spa-1B at XwPt743523) 4B (QCbt.spa-4B at XwPt-744434-Xwmc617), 4D (QCbt.spa-4D at XwPt-9747), 5B (QCbt.spa-5B at XtPt-3719) and 7D (QCbt.spa-7D at Xwmc273). Significant epistatic interactions were identified for percent bunt incidence between QCbt.spa-1B × QCbt.spa-4B and QCbt.spa-1B × QCbt.spa-6D, and QTL by environment interaction between QCbt.spa-1B × QCbt.spa-6D. Plant height QTL were found on chromosomes 4B (QPh.spa-4B) and 6D (QPh.spa-6D) that co-located with bunt resistance QTL. The identification of previously unreported common bunt resistance QTL (on chromosomes 4B, 4D and 7D), and new understanding of QTL × QTL interactions will facilitate marker-assisted breeding for common bunt resistance.
培育小麦对散黑穗病的田间抗性需要考虑多个基因以及上位性和数量性状基因座与环境的互作。与散黑穗病定量抗性相关的基因座与包括株高和抗锈性在内的其他有益性状共定位。
散黑穗病，也称为腥黑穗病，由种子携带的真菌小麦网腥黑粉菌（Tilletia tritici (Bjerk.) Wint. [同义词：Tilletia caries (DC.) Tul.]）和光腥黑粉菌（Tilletia laevis Kühn [同义词：Tilletia foetida (Wallr.) Liro.]）引起。已知散黑穗病会因病粒形成和籽粒侵染导致小麦产量和品质损失。本研究的目的是鉴定和定位散黑穗病抗性的数量性状基因座（QTL），研究已鉴定QTL之间的上位性互作，并调查散黑穗病抗性与株高的共定位情况。利用多态性全基因组微卫星和DArT(®)标记对来自Carberry/AC Cadillac杂交组合的261个双单倍体系以及对照进行基因分型。这些株系于2011年、2012年和2013年在单独的苗圃中种植，用于评估散黑穗病发病率和株高。AC Cadillac在6D染色体上的标记XwPt - 1695、XwPt - 672044和XwPt - 5114处贡献了一个散黑穗病抗性QTL（QCbt.spa - 6D）。Carberry在1B（XwPt743523处的QCbt.spa - 1B）、4B（XwPt - 744434 - Xwmc617处的QCbt.spa - 4B）、4D（XwPt - 9747处的QCbt.spa - 4D）、5B（XtPt - 3719处的QCbt.spa - 5B）和7D（Xwmc273处的QCbt.spa - 7D）染色体上贡献了散黑穗病抗性QTL。在QCbt.spa - 1B×QCbt.spa - 4B和QCbt.spa - 1B×QCbt.spa - 6D之间鉴定到了散黑穗病发病率百分比的显著上位性互作，以及QCbt.spa - 1B×QCbt.spa - 6D之间的QTL与环境互作。在4B（QPh.spa - 4B）和6D（QPh.spa - 6D）染色体上发现了与散黑穗病抗性QTL共定位的株高QTL。鉴定出先前未报道的散黑穗病抗性QTL（位于4B、4D和7D染色体上）以及对QTL×QTL互作的新认识将有助于散黑穗病抗性的分子标记辅助育种。
