Graduate Institute of Electronics Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Rd., Taipei 10617, Taiwan.
Research Center for Applied Sciences, Academia Sinica, No. 128, Sec. 2, Academia Rd., Taipei 11529, Taiwan.
Sci Rep. 2017 Feb 8;7:42146. doi: 10.1038/srep42146.
A growth model is proposed for the large-area and uniform MoS film grown by using sulfurization of pre-deposited Mo films on sapphire substrates. During the sulfurization procedure, the competition between the two mechanisms of the Mo oxide segregation to form small clusters and the sulfurization reaction to form planar MoS film is determined by the amount of background sulfur. Small Mo oxide clusters are observed under the sulfur deficient condition, while large-area and complete MoS films are obtained under the sulfur sufficient condition. Precise layer number controllability is also achieved by controlling the pre-deposited Mo film thicknesses. The drain currents in positive dependence on the layer numbers of the MoS transistors with 1-, 3- and 5- layer MoS have demonstrated small variation in material characteristics between each MoS layer prepared by using this growth technique. By sequential transition metal deposition and sulfurization procedures, a WS/MoS/WS double hetero-structure is demonstrated. Large-area growth, layer number controllability and the possibility of hetero-structure establishment by using sequential metal deposition and following sulfurization procedures have revealed the potential of this growth technique for practical applications.
提出了一种在蓝宝石衬底上通过预沉积 Mo 膜的硫化生长大面积、均匀 MoS 膜的生长模型。在硫化过程中,形成小团簇的 Mo 氧化物分凝机制和形成平面 MoS 膜的硫化反应之间的竞争取决于背景硫的数量。在缺硫条件下观察到小的 Mo 氧化物团簇,而在硫充足条件下则获得大面积和完整的 MoS 膜。通过控制预沉积 Mo 膜的厚度,还实现了精确的层数量可控性。具有 1 层、3 层和 5 层 MoS 的 MoS 晶体管的漏电流与 MoS 层的层数呈正相关,这表明使用这种生长技术制备的每个 MoS 层之间的材料特性变化很小。通过顺序过渡金属沉积和硫化程序,展示了 WS/MoS/WS 双异质结构。大面积生长、层数量可控性以及通过顺序金属沉积和随后的硫化程序建立异质结构的可能性揭示了这种生长技术在实际应用中的潜力。