通过为像差光学器件适配矫正眼镜实现完美的 X 射线聚焦。

Institute of Structural Physics, Technische Universität Dresden, 01062 Dresden, Germany.

Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.

Nat Commun. 2017 Mar 1;8:14623. doi: 10.1038/ncomms14623.

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

由于其短波长，X 射线原则上可以聚焦到几纳米以下。与此同时，正是这种短波长对 X 射线光学及其计量学提出了严格的要求。这两者都受到当今技术的限制。在这项工作中，我们使用叠层相位成像术对折射 X 射线透镜的残余像差进行了精确的波长测量，以制造校正相位板。与拟合的相位板一起，该光学器件表现出衍射极限性能，产生了一个近高斯光束轮廓，斯特列尔比超过 0.8。该方案可应用于任何其他聚焦光学器件，从而解决同步辐射光源和 X 射线自由电子激光器中的 X 射线光学问题。