Angelé-Martínez Carlos, Nguyen Khanh Van T, Ameer Fathima S, Anker Jeffrey N, Brumaghim Julia L
a Department of Chemistry , Clemson University , Clemson , SC , USA.
b School of Biotechnology, International University - Vietnam National University, Ho Chi Minh City , Vietnam.
Nanotoxicology. 2017 Mar;11(2):278-288. doi: 10.1080/17435390.2017.1293750.
Copper(II) oxide nanoparticles (CuO) have many industrial applications, but are highly cytotoxic because they generate reactive oxygen species (ROS). It is unknown whether the damaging ROS are generated primarily from copper leached from the nanoparticles, or whether the nanoparticle surface plays a significant role. To address this question, we separated nanoparticles from the supernatant containing dissolved copper, and measured their ability to damage plasmid DNA with addition of hydrogen peroxide, ascorbate, or both. While DNA damage from the supernatant (measured using an electrophoresis assay) can be explained solely by dissolved copper ions, damage by the nanoparticles in the presence of ascorbate is an order of magnitude higher than can be explained by dissolved copper and must, therefore, depend primarily upon the nanoparticle surface. DNA damage is time-dependent, with shorter incubation times resulting in higher EC values. Hydroxyl radical (OH) is the main ROS generated by CuO/hydrogen peroxide as determined by EPR measurements; CuO/hydrogen peroxide/ascorbate conditions generate ascorbyl, hydroxyl, and superoxide radicals. Thus, CuO generate ROS through several mechanisms, likely including Fenton-like and Haber-Weiss reactions from the surface or dissolved copper ions. The same radical species were observed when CuO suspensions were replaced with the supernatant containing leached copper, washed CuO, or dissolved copper solutions. Overall, CuO generate significantly more ROS and DNA damage in the presence of ascorbate than can be explained simply from dissolved copper, and the CuO surface must play a large role.
氧化铜纳米颗粒(CuO)有许多工业应用,但具有高细胞毒性,因为它们会产生活性氧(ROS)。目前尚不清楚造成损害的ROS主要是由纳米颗粒中浸出的铜产生的,还是纳米颗粒表面起了重要作用。为了解决这个问题,我们将纳米颗粒与含有溶解铜的上清液分离,并通过添加过氧化氢、抗坏血酸或两者来测量它们破坏质粒DNA的能力。虽然上清液造成的DNA损伤(使用电泳测定法测量)可以仅由溶解的铜离子来解释,但在抗坏血酸存在的情况下,纳米颗粒造成的损伤比溶解铜所能解释的高出一个数量级,因此,这主要取决于纳米颗粒表面。DNA损伤是时间依赖性的,孵育时间越短,EC值越高。通过电子顺磁共振测量确定,羟基自由基(OH)是CuO/过氧化氢产生的主要ROS;CuO/过氧化氢/抗坏血酸条件下会产生活性氧、羟基自由基和超氧自由基。因此,CuO通过多种机制产生活性氧,可能包括表面或溶解铜离子引发的类芬顿反应和哈伯-维伊斯反应。当用含有浸出铜的上清液、洗涤后的CuO或溶解铜溶液替代CuO悬浮液时,观察到了相同的自由基种类。总体而言,在抗坏血酸存在的情况下,CuO产生活性氧和造成DNA损伤的程度明显高于仅由溶解铜所能解释的程度,而且CuO表面必定起了很大作用。