Nagoya Institute of Technology, Department of Frontier Materials, Graduate School of Engineering, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan.
Universiti Pendidikan Sultan Idris, Department of Chemistry, Faculty of Science and Mathematics, 35900 Tanjong Malim, Perak, Malaysia.
Sci Rep. 2017 Mar 2;7:43756. doi: 10.1038/srep43756.
Low-temperature growth, as well as the transfer free growth on substrates, is the major concern of graphene research for its practical applications. Here we propose a simple method to achieve the transfer free graphene growth on SiO covered Si (SiO/Si) substrate at 250 °C based on a solid-liquid-solid reaction. The key to this approach is the catalyst metal, which is not popular for graphene growth by chemical vapor deposition. A catalyst metal film of 500 nm thick was deposited onto an amorphous C (50 nm thick) coated SiO/Si substrate. The sample was then annealed at 250 °C under vacuum condition. Raman spectra measured after the removal of the catalyst by chemical etching showed intense G and 2D peaks together with a small D and intense SiO related peaks, confirming the transfer free growth of multilayer graphene on SiO/Si. The domain size of the graphene confirmed by optical microscope and atomic force microscope was about 5 μm in an average. Thus, this approach will open up a new route for transfer free graphene growth at low temperatures.
低温生长以及在基底上无转移生长是石墨烯研究的主要关注点,因为这与其实用应用有关。在这里,我们提出了一种简单的方法,基于固-液-固反应,在 250°C 的条件下,在覆盖有 SiO2 的 Si(SiO2/Si)衬底上实现无转移的石墨烯生长。这种方法的关键是催化剂金属,这对于化学气相沉积法生长石墨烯来说并不常见。我们在一层 50nm 厚的非晶碳(a-C)上沉积了 500nm 厚的催化剂金属薄膜,然后在真空条件下于 250°C 退火。通过化学刻蚀去除催化剂后测量的 Raman 光谱显示出强烈的 G 和 2D 峰,以及较小的 D 峰和强烈的 SiO 相关峰,这证实了多层石墨烯在 SiO2/Si 上的无转移生长。通过光学显微镜和原子力显微镜确认的石墨烯的畴尺寸平均约为 5μm。因此,这种方法将为低温下无转移的石墨烯生长开辟新途径。