Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA.
Terahertz Materials Analysis Center, Department of Physics, Chemistry and Biology, Linköping University, SE 581 83, Linköping, Sweden.
Sci Rep. 2017 Jul 11;7(1):5151. doi: 10.1038/s41598-017-05333-w.
Unraveling the doping-related charge carrier scattering mechanisms in two-dimensional materials such as graphene is vital for limiting parasitic electrical conductivity losses in future electronic applications. While electric field doping is well understood, assessment of mobility and density as a function of chemical doping remained a challenge thus far. In this work, we investigate the effects of cyclically exposing epitaxial graphene to controlled inert gases and ambient humidity conditions, while measuring the Lorentz force-induced birefringence in graphene at Terahertz frequencies in magnetic fields. This technique, previously identified as the optical analogue of the electrical Hall effect, permits here measurement of charge carrier type, density, and mobility in epitaxial graphene on silicon-face silicon carbide. We observe a distinct, nearly linear relationship between mobility and electron charge density, similar to field-effect induced changes measured in electrical Hall bar devices previously. The observed doping process is completely reversible and independent of the type of inert gas exposure.
揭示二维材料(如石墨烯)中与掺杂相关的电荷载流子散射机制对于限制未来电子应用中寄生电导率损耗至关重要。虽然电场掺杂已经得到很好的理解,但迄今为止,评估化学掺杂下的迁移率和密度仍然是一个挑战。在这项工作中,我们研究了周期性地将外延石墨烯暴露于受控的惰性气体和环境湿度条件下的影响,同时在磁场中测量太赫兹频率下石墨烯的洛伦兹力诱导双折射。这项技术之前被确定为电霍尔效应的光学模拟,在这里可以测量硅面碳化硅上外延石墨烯中的载流子类型、密度和迁移率。我们观察到迁移率和电子电荷密度之间存在明显的近乎线性关系,类似于之前在电霍尔条器件中测量到的场效应诱导变化。观察到的掺杂过程是完全可逆的,与惰性气体暴露的类型无关。