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双轴拉伸应变锗纳米线的理论研究

Theoretical Investigation of Biaxially Tensile-Strained Germanium Nanowires.

作者信息

Zhu Zhongyunshen, Song Yuxin, Chen Qimiao, Zhang Zhenpu, Zhang Liyao, Li Yaoyao, Wang Shumin

机构信息

State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China.

School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.

出版信息

Nanoscale Res Lett. 2017 Dec;12(1):472. doi: 10.1186/s11671-017-2243-1. Epub 2017 Jul 28.

Abstract

We theoretically investigate highly tensile-strained Ge nanowires laterally on GaSb. Finite element method has been used to simulate the residual elastic strain in the Ge nanowire. The total energy increment including strain energy, surface energy, and edge energy before and after Ge deposition is calculated in different situations. The result indicates that the Ge nanowire on GaSb is apt to grow along 〈100〉 rather than 〈110〉 in the two situations and prefers to be exposed by {105} facets when deposited a small amount of Ge but to be exposed by {110} when the amount of Ge exceeds a critical value. Furthermore, the conduction band minima in Γ-valley at any position in both situations exhibits lower values than those in L-valley, leading to direct bandgap transition in Ge nanowire. For the valence band, the light hole band maxima at Γ-point is higher than the heavy hole band maxima at any position and even higher than the conduction band minima for the hydrostatic strain more than ∼5.0%, leading to a negative bandgap. In addition, both electron and hole mobility can be enhanced by owing to the decrease of the effective mass under highly tensile strain. The results suggest that biaxially tensile-strained Ge nanowires hold promising properties in device applications.

摘要

我们从理论上横向研究了在GaSb上的高拉伸应变锗纳米线。采用有限元方法模拟了锗纳米线中的残余弹性应变。计算了不同情况下锗沉积前后包括应变能、表面能和边缘能在内的总能量增量。结果表明,在两种情况下,GaSb上的锗纳米线倾向于沿〈100〉方向生长而非〈110〉方向,并且在沉积少量锗时倾向于以{105}面暴露,而当锗的量超过临界值时则倾向于以{110}面暴露。此外,在两种情况下,Γ谷中任意位置的导带最小值都低于L谷中的导带最小值,导致锗纳米线中发生直接带隙跃迁。对于价带,在Γ点的轻空穴带最大值高于任意位置的重空穴带最大值,并且对于超过约5.0%的静水应变,甚至高于导带最小值,导致负带隙。此外,由于在高拉伸应变下有效质量的降低,电子和空穴迁移率都可以得到提高。结果表明,双轴拉伸应变锗纳米线在器件应用中具有良好的性能。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fb5a/5533697/5dcb2c36156d/11671_2017_2243_Fig1_HTML.jpg

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