Suppr超能文献

对MoS欧姆接触的新见解:通过调节MoS亲和能而非金属功函数。

A new insight for ohmic contacts to MoS: by tuning MoS affinity energies but not metal work-functions.

作者信息

Wang Qian, Deng Bei, Shi Xingqiang

机构信息

Harbin Institute of Technology, Harbin 150080, China.

出版信息

Phys Chem Chem Phys. 2017 Oct 4;19(38):26151-26157. doi: 10.1039/c7cp05109c.

Abstract

Two-dimensional (2D) transition metal dichalcogenides (TMDCs) have recently attracted tremendous interest for fundamental studies and applications. High contact resistances between the metal electrodes and the 2D TMDCs, usually composed of a tunneling barrier (TB) and a Schottky barrier (SB), are the key bottleneck to the realization of high performance devices based on such systems. Here, from van der Waals density functional theory calculations, we demonstrate that strain can provide a feasible means to reduce the contact resistances between, for example, 2D semiconductor MoS and metal surfaces, in both strong and weak coupling regimes. Both the SB and TB are lowered significantly with the increasing tensile strain in both the coupling regimes. Especially, the SB can reduce to zero in all configurations considered, with tensile strain increasing to ∼4% or above. The mechanism of SB reduction under tensile strain is attributed to the increase of the MoS affinity energy since the monolayer MoS conduction band minimum (CBm) is derived from anti-bonding states. Thus, the SB in other semiconducting TMDCs with an anti-bonding CBm (for n-type contact) could also be reduced to zero by tensile strain. Our discoveries thus shed a new and general light on minimizing the contact resistance of semiconducting TMDCs-metal based contacts and this can also prove applicable to other 2D semiconductors, e.g. phosphorene.

摘要

二维(2D)过渡金属二硫属化物(TMDCs)近来在基础研究和应用方面引起了极大关注。金属电极与二维TMDCs之间的高接触电阻,通常由隧穿势垒(TB)和肖特基势垒(SB)组成,是基于此类系统实现高性能器件的关键瓶颈。在此,通过范德华密度泛函理论计算,我们证明应变能够提供一种可行的方法来降低例如二维半导体MoS与金属表面在强耦合和弱耦合两种情况下的接触电阻。在这两种耦合情况下,随着拉伸应变的增加,SB和TB均显著降低。特别地,在所考虑的所有构型中,随着拉伸应变增加至约4%或更高,SB可降至零。拉伸应变下SB降低的机制归因于MoS亲和能的增加,因为单层MoS导带最小值(CBm)源自反键态。因此,对于具有反键CBm(用于n型接触)的其他半导体TMDCs,其SB也可通过拉伸应变降至零。我们的发现因此为最小化半导体TMDCs-金属基接触的接触电阻提供了新的通用思路,并且这也可证明适用于其他二维半导体,例如黑磷。

相似文献

1
A new insight for ohmic contacts to MoS: by tuning MoS affinity energies but not metal work-functions.
Phys Chem Chem Phys. 2017 Oct 4;19(38):26151-26157. doi: 10.1039/c7cp05109c.
2
Van der Waals contacts between three-dimensional metals and two-dimensional semiconductors.
Nature. 2019 Apr;568(7750):70-74. doi: 10.1038/s41586-019-1052-3. Epub 2019 Mar 27.
3
Fermi Level Pinning at Electrical Metal Contacts of Monolayer Molybdenum Dichalcogenides.
ACS Nano. 2017 Feb 28;11(2):1588-1596. doi: 10.1021/acsnano.6b07159. Epub 2017 Jan 23.
4
Absence of a Band Gap at the Interface of a Metal and Highly Doped Monolayer MoS.
Nano Lett. 2017 Oct 11;17(10):5962-5968. doi: 10.1021/acs.nanolett.7b01986. Epub 2017 Sep 20.
6
3D Behavior of Schottky Barriers of 2D Transition-Metal Dichalcogenides.
ACS Appl Mater Interfaces. 2015 Nov 25;7(46):25709-15. doi: 10.1021/acsami.5b06897. Epub 2015 Nov 11.
7
Designing barrier-free metal/MoS contacts through electrene insertion.
Phys Chem Chem Phys. 2024 Jun 19;26(24):16947-16954. doi: 10.1039/d3cp06112d.
8
Ohmic contacts of the two-dimensional CaN/MoS donor-acceptor heterostructure.
Phys Chem Chem Phys. 2023 Jun 7;25(22):15433-15440. doi: 10.1039/d3cp01412f.
9
The modulation of Schottky barriers of metal-MoS2 contacts via BN-MoS2 heterostructures.
Phys Chem Chem Phys. 2016 Jun 22;18(25):16882-9. doi: 10.1039/c6cp02132h.
10
Clean Interface Contact Using a ZnO Interlayer for Low-Contact-Resistance MoS Transistors.
ACS Appl Mater Interfaces. 2020 Jan 29;12(4):5031-5039. doi: 10.1021/acsami.9b18591. Epub 2020 Jan 13.

引用本文的文献

1
In Situ TEM Study of Electrical Property and Mechanical Deformation in MoS/Graphene Heterostructures.
Nanomaterials (Basel). 2025 Jan 14;15(2):114. doi: 10.3390/nano15020114.
2
Interface contact and modulated electronic properties by in-plain strains in a graphene-MoS heterostructure.
RSC Adv. 2023 Jan 19;13(5):2903-2911. doi: 10.1039/d2ra07949f. eCollection 2023 Jan 18.
3
Electron Irradiation of Metal Contacts in Monolayer MoS Field-Effect Transistors.
ACS Appl Mater Interfaces. 2020 Sep 9;12(36):40532-40540. doi: 10.1021/acsami.0c11933. Epub 2020 Aug 26.

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验