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多态性和薄膜形态在溶液剪切处理的有机半导体中的作用。

Role of Polymorphism and Thin-Film Morphology in Organic Semiconductors Processed by Solution Shearing.

作者信息

Riera-Galindo Sergi, Tamayo Adrián, Mas-Torrent Marta

机构信息

Institut de Ciència de Materials de Barcelona (ICMAB-CSIC) and Networking Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Campus de la Universitat UAB, Cerdanyola, E-08193 Barcelona, Spain.

出版信息

ACS Omega. 2018 Feb 28;3(2):2329-2339. doi: 10.1021/acsomega.8b00043. Epub 2018 Feb 27.

Abstract

Organic semiconductors (OSCs) are promising materials for cost-effective production of electronic devices because they can be processed from solution employing high-throughput techniques. However, small-molecule OSCs are prone to structural modifications because of the presence of weak van der Waals intermolecular interactions. Hence, controlling the crystallization in these materials is pivotal to achieve high device reproducibility. In this perspective article, we focus on controlling polymorphism and morphology in small-molecule organic semiconducting thin films deposited by solution-shearing techniques compatible with roll-to-roll systems. Special attention is paid to the influence that the different experimental deposition parameters can have on thin films. Further, the main characterization techniques for thin-film structures are reviewed, highlighting the in situ characterization tools that can provide crucial insights into the crystallization mechanisms.

摘要

有机半导体(OSCs)是用于经济高效地生产电子器件的有前景的材料,因为它们可以通过采用高通量技术的溶液法进行加工。然而,由于存在较弱的范德华分子间相互作用,小分子有机半导体易于发生结构改性。因此,控制这些材料中的结晶对于实现高器件重现性至关重要。在这篇观点文章中,我们专注于控制通过与卷对卷系统兼容的溶液剪切技术沉积的小分子有机半导体薄膜中的多晶型和形态。特别关注不同的实验沉积参数对薄膜可能产生的影响。此外,还综述了薄膜结构的主要表征技术,突出了能够为结晶机制提供关键见解的原位表征工具。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/79d5/6645795/bf0d966d39f9/ao-2018-00043w_0001.jpg

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