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具有六角形反点晶格纳米结构的DyFe薄膜中垂直磁各向异性的调控

Tailoring of Perpendicular Magnetic Anisotropy in DyFe Thin Films with Hexagonal Antidot Lattice Nanostructure.

作者信息

Salaheldeen Mohamed, Vega Victor, Ibabe Angel, Jaafar Miriam, Asenjo Agustina, Fernandez Agustin, Prida Victor M

机构信息

Physics Department, Faculty of Science, Sohag University, 82524 Sohag, Egypt.

Depto. Física, Universidad de Oviedo, C/Federico Garcia Lorca 18, 33007 Oviedo, Asturias, Spain.

出版信息

Nanomaterials (Basel). 2018 Apr 8;8(4):227. doi: 10.3390/nano8040227.

Abstract

In this article, the magnetic properties of hexagonally ordered antidot arrays made of DyFe alloy are studied and compared with corresponding ones of continuous thin films with the same compositions and thicknesses, varying between 20 nm and 50 nm. Both samples, the continuous thin films and antidot arrays, were prepared by high vacuum e-beam evaporation of the alloy on the top-surface of glass and hexagonally self-ordered nanoporous alumina templates, which serve as substrates, respectively. By using a highly sensitive magneto-optical Kerr effect (MOKE) and vibrating sample magnetometer (VSM) measurements an interesting phenomenon has been observed, consisting in the easy magnetization axis transfer from a purely in-plane (INP) magnetic anisotropy to out-of-plane (OOP) magnetization. For the 30 nm film thickness we have measured the volume hysteresis loops by VSM with the easy magnetization axis lying along the OOP direction. Using magnetic force microscopy measurements (MFM), there is strong evidence to suggest that the formation of magnetic domains with OOP magnetization occurs in this sample. This phenomenon can be of high interest for the development of novel magnetic and magneto-optic perpendicular recording patterned media based on template-assisted deposition techniques.

摘要

在本文中,研究了由镝铁合金制成的六角有序反点阵列的磁性能,并将其与相同成分和厚度(在20纳米至50纳米之间变化)的连续薄膜的相应磁性能进行了比较。连续薄膜和反点阵列这两种样品分别是通过在玻璃和六角自组装纳米多孔氧化铝模板(分别作为衬底)的顶表面上对合金进行高真空电子束蒸发制备的。通过使用高灵敏度磁光克尔效应(MOKE)和振动样品磁强计(VSM)测量,观察到了一个有趣的现象,即易磁化轴从纯面内(INP)磁各向异性转移到了面外(OOP)磁化。对于30纳米厚的薄膜,我们使用VSM测量了易磁化轴沿OOP方向的体积磁滞回线。通过磁力显微镜测量(MFM),有强有力的证据表明该样品中出现了具有OOP磁化的磁畴。对于基于模板辅助沉积技术的新型磁性和磁光垂直记录图案化介质的开发而言,这一现象可能具有很高的研究价值。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/5761/5923557/701b1f3ab1ae/nanomaterials-08-00227-g001.jpg

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