Chen Ying, Chou Tzu-Chieh, Fang Ching-Hsing, Lu Cheng-Yi, Hsiao Chien-Nan, Hsu Wei-Ting, Chen Chien-Chun
Department of Engineering and System Science, National Tsing Hua University, Hsinchu, 300044, Taiwan.
Department of Physics, National Tsing Hua University, Hsinchu, 300044, Taiwan.
Sci Rep. 2024 Jan 2;14(1):277. doi: 10.1038/s41598-023-50784-z.
Electron ptychography has emerged as a popular technology for high-resolution imaging by combining the high coherence of electron sources with the ultra-fast scanning electron coil. However, the limitations of conventional pixelated detectors, including poor dynamic range and slow data readout speeds, have posed restrictions in the past on conducting electron ptychography experiments. We used the Gatan STELA pixelated detector to capture sequential diffraction data of monolayer two-dimensional (2D) materials for ptychographic reconstruction. By using the pixelated detector and electron ptychography, we demonstrate the observation of the radiation damage at atomic resolution in Transition Metal Dichalcogenides (TMDs).
通过将电子源的高相干性与超快扫描电子线圈相结合，电子叠层成像术已成为一种用于高分辨率成像的流行技术。然而，传统像素探测器的局限性，包括动态范围差和数据读出速度慢，过去对进行电子叠层成像实验造成了限制。我们使用Gatan STELA像素探测器来捕获单层二维（2D）材料的连续衍射数据，以进行叠层成像重建。通过使用像素探测器和电子叠层成像术，我们展示了在过渡金属二硫属化物（TMD）中以原子分辨率观察辐射损伤的情况。
