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pJ级能耗、低电压铁电有机场效应晶体管存储器

pJ-Level Energy-Consuming, Low-Voltage Ferroelectric Organic Field-Effect Transistor Memories.

作者信息

Pei Mengjiao, Qian Jun, Jiang Sai, Guo Jianhang, Yang Chengdong, Pan Danfeng, Wang Qijing, Wang Xinran, Shi Yi, Li Yun

机构信息

National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures , Nanjing University , Nanjing , Jiangsu 210093 , People's Republic of China.

出版信息

J Phys Chem Lett. 2019 May 16;10(10):2335-2340. doi: 10.1021/acs.jpclett.9b00864. Epub 2019 Apr 26.

Abstract

Ferroelectric organic field-effect transistors (Fe-OFETs) have attracted considerable attention because of their promising potential for memory applications, while a critical issue is the large energy consumption mainly caused by a high operating voltage and slow data switching. Here, we employ ultrathin ferroelectric polymer and semiconducting molecular crystals to create low-voltage Fe-OFET memories. Devices require only pJ-level energy consumption. The writing and erasing processes require ∼1.2 and 1.6 pJ/bit, respectively, and the reading energy is ∼1.9 pJ/bit (on state) and ∼0.2 fJ/bit (off state). Thus, our memories consume only <0.1% of the energy required for devices using bulk functional layers. Besides, our devices also exhibit low contact resistance and steep subthreshold swing. Therefore, we provide a strategy that opens up a path for Fe-OFETs toward emerging applications, such as wearable electronics.

摘要

铁电有机场效应晶体管(Fe-OFET)因其在存储器应用方面的巨大潜力而备受关注,然而一个关键问题是其能耗大,主要是由高工作电压和缓慢的数据切换所致。在此,我们采用超薄铁电聚合物和半导体分子晶体来制造低电压Fe-OFET存储器。这些器件仅需皮焦耳级的能耗。写入和擦除过程分别需要约1.2和1.6皮焦耳/比特,读取能量在导通状态下约为1.9皮焦耳/比特,在截止状态下约为0.2飞焦耳/比特。因此,我们的存储器能耗仅为使用体功能层的器件所需能量的不到0.1%。此外,我们的器件还表现出低接触电阻和陡峭的亚阈值摆幅。所以,我们提供了一种策略,为Fe-OFET迈向可穿戴电子等新兴应用开辟了一条道路。

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