Xia Haojie, Cao Guiping, Dong Ning
School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei, Anhui 230009, China.
China Research Center of High Speed Machine Vision of Hefei i-Tek OptoElectronics Co., Ltd., Hefei, Anhui 230088, China.
Rev Sci Instrum. 2019 Apr;90(4):044706. doi: 10.1063/1.5084014.
Based on the adaptive logic module structure implemented in a 28 nm field programmable gate array (FPGA), we propose an interleaved sampling method, together with bin realignment operation, to enable time-to-digital converter (TDC) implementation. The tap status is sampled twice in a single physical channel, meaning that TDC precision beyond the cell delay limit can be anticipated. Two TDC channels were implemented in a 28 nm Cyclone-V FPGA, and the effectiveness of the proposed method was evaluated. After calibration, the TDC produced a timing resolution of 6.6 ps root mean square or 5.8 ps per least significant bit.
基于在28纳米现场可编程门阵列(FPGA)中实现的自适应逻辑模块结构,我们提出了一种交织采样方法,并结合bin重排操作,以实现时间数字转换器(TDC)。在单个物理通道中对抽头状态进行两次采样,这意味着可以预期TDC精度超出单元延迟限制。在28纳米Cyclone-V FPGA中实现了两个TDC通道,并对所提方法的有效性进行了评估。校准后,TDC产生的定时分辨率为均方根6.6皮秒或每最低有效位5.8皮秒。