Department of Genetics and Plant Breeding, Faculty of Agronomy and Bioengineering, Poznań University of Life Sciences, 11 Dojazd Str, 60-632, Poznań, Poland.
J Appl Genet. 2019 Nov;60(3-4):301-304. doi: 10.1007/s13353-019-00520-z. Epub 2019 Sep 10.
Leaf rust caused by Puccinia triticina belongs to one of the most dangerous fungal diseases of wheat (Triticum aestivum L.) and is the cause of large yield losses every year. Here we report a multiplex polymerase chain reaction (PCR) assay, which was developed for detection of two important wheat slow rust resistance genes Lr34 and Lr46, using two molecular markers: csLV34 and Xwmc44, respectively. The presence of genes was analyzed in one winter wheat variety TX89D6435 and five spring wheat varieties: Pavon F76, Parula 'S', Rayon 89, Kern, Mochis 88. Both Lr34 and Lr46 genes were identified in variety TX89D6435, gene Lr34 was also identified in Parula 'S' and Kern varieties, and gene L46 occurs in Pavon F76 and Mochis 88 variety. None of the resistance genes tested was detected in the Rayon 89 variety. The use of the multiplex PCR method allowed to shorten the analysis time, reduce costs of analyses, and reduce the workload.
由小麦叶锈菌引起的叶锈病属于小麦（Triticum aestivum L.）最危险的真菌病害之一，每年都会导致大量的产量损失。在这里，我们报告了一种多重聚合酶链反应（PCR）检测方法，该方法使用两个分子标记 csLV34 和 Xwmc44，分别检测两个重要的小麦慢锈性基因 Lr34 和 Lr46。在一个冬小麦品种 TX89D6435 和五个春小麦品种中分析了基因的存在：Pavon F76、Parula 'S'、Rayon 89、Kern 和 Mochis 88。在品种 TX89D6435 中鉴定出 Lr34 和 Lr46 基因，在 Parula 'S' 和 Kern 品种中也鉴定出 Lr34 基因，而 L46 基因存在于 Pavon F76 和 Mochis 88 品种中。在 Rayon 89 品种中未检测到任何抗性基因。使用多重 PCR 方法可以缩短分析时间，降低分析成本，并减少工作量。
