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,一个用于叠层成像数据高性能分析的通用高级框架。

, a versatile high-level framework for high-performance analysis of ptychographic data.

作者信息

Wakonig Klaus, Stadler Hans-Christian, Odstrčil Michal, Tsai Esther H R, Diaz Ana, Holler Mirko, Usov Ivan, Raabe Jörg, Menzel Andreas, Guizar-Sicairos Manuel

机构信息

Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

ETH and University of Zürich, Institute for Biomedical Engineering, 8093 Zürich, Switzerland.

出版信息

J Appl Crystallogr. 2020 Mar 13;53(Pt 2):574-586. doi: 10.1107/S1600576720001776. eCollection 2020 Apr 1.

Abstract

Over the past decade, ptychography has been proven to be a robust tool for non-destructive high-resolution quantitative electron, X-ray and optical microscopy. It allows for quantitative reconstruction of the specimen's transmissivity, as well as recovery of the illuminating wavefront. Additionally, various algorithms have been developed to account for systematic errors and improved convergence. With fast ptychographic microscopes and more advanced algorithms, both the complexity of the reconstruction task and the data volume increase significantly. is a software package which combines high-level modularity for easy and fast changes to the data-processing pipeline, and high-performance computing on CPUs and GPUs.

摘要

在过去十年中,叠层成像已被证明是一种用于无损高分辨率定量电子、X射线和光学显微镜的强大工具。它能够对样品的透过率进行定量重建,同时恢复照明波前。此外,还开发了各种算法来处理系统误差并提高收敛性。随着快速叠层成像显微镜和更先进算法的出现,重建任务的复杂性和数据量都显著增加。[软件名称]是一个软件包,它结合了高级模块化,便于对数据处理管道进行轻松快速的更改,并在CPU和GPU上实现高性能计算。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fde2/7133065/4f7d40e468f5/j-53-00574-fig1.jpg

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