Jordan University of Science and Technology, Faculty of Dentistry, Department of Conservative Dentistry, Irbid 22110, Jordan.
University of Otago, Faculty of Dentistry, 310 Great King Street, Dunedin 9016, New Zealand.
J Dent. 2020 Oct;101:103447. doi: 10.1016/j.jdent.2020.103447. Epub 2020 Aug 5.
To assess the surface roughness and residual flaws in two translucent zirconia substrates following simulated clinical adjustment and intra-oral finishing/polishing.
Specimens were prepared from two translucent (5Y-ZP/8Y-ZP) and one conventional (3Y-TZP) zirconia substrates (n = 84 p/g). Arithmetic mean roughness parameter (R) was determined for all experimental groups at four stages (n = 21 p/g): (1) as-sintered, (2) surface grinding using a zirconia cutting diamond bur, (3) polishing using 1-step, 2-step or 4-step intra-oral polishing kits, and (4) laboratory polishing/glazing. Scanning electron microscopy (SEM) was used to evaluate residual surface flaws. Data were statistically analysed using a two-way ANOVA test, multiple and pairwise comparisons were performed using a Bonferroni post hoc test.
R was significantly higher for as-sintered and ground 5Y-ZP/8Y-ZP compared to 3Y-TZP (p ≤ 0.001). Material type and polishing protocol had statistically significant effect on R (p < 0.001). The 4-step polishing resulted in the lowest R in 3Y-TZP/5Y-ZP (p ≤ 0.001). No significant differences were observed between different polishing protocols in 8Y-ZP (p≥0.655). Glazing significantly reduced R in all materials compared to other polishing protocols (p ≤ 0.001) except for the 4-step protocol in 3Y-TZP (p = 0.195). SEM revealed pronounced surface flaws in ground 5Y-ZP/8Y-ZP. Grinding of 3Y-TZP induced ductile material removal and thereby, minimal cohesive material loss. The 4-step polishing protocol resulted in the fewest and shallowest surface flaws in all groups. Glazing of 3Y-TZP resulted in the most homogenous surface contrary to 5Y-ZP/8Y-ZP.
The finest surface finish was achieved using the 4-step polishing protocol in all studied materials. This protocol might be inadequate however for polishing of ground 5Y-ZP/8Y-ZP as a result of the pronounced surface damage induced by the grinding process. The glazing of 5Y-ZP/8Y-ZP might not be as predictable as for 3Y-TZP.
The higher susceptibility to surface damage, as a result of increasing dopant concentration, may render polishing of ground, translucent zirconia more complicated compared to the conventional 3Y-TZP counterparts.
评估模拟临床调整和口腔内修整/抛光后两种半透明氧化锆基底的表面粗糙度和残留缺陷。
从两种半透明(5Y-ZP/8Y-ZP)和一种传统(3Y-TZP)氧化锆基底(n=84 p/g)制备标本。在四个阶段(n=21 p/g)确定所有实验组的算术平均粗糙度参数(R):(1)烧结后,(2)使用氧化锆切割金刚石车刀进行表面磨削,(3)使用一步法、两步法或四步法口腔内抛光套件进行抛光,和(4)实验室抛光/上釉。使用扫描电子显微镜(SEM)评估残留表面缺陷。使用双向方差分析检验数据,使用 Bonferroni 事后检验进行多重和成对比较。
与 3Y-TZP 相比,烧结后和磨削后的 5Y-ZP/8Y-ZP 的 R 显著更高(p≤0.001)。材料类型和抛光方案对 R 有统计学显著影响(p<0.001)。四步抛光在 3Y-TZP/5Y-ZP 中导致最低的 R(p≤0.001)。在 8Y-ZP 中,不同抛光方案之间未观察到显著差异(p≥0.655)。与其他抛光方案相比,上釉可显著降低所有材料的 R(p≤0.001),但 3Y-TZP 的四步抛光方案除外(p=0.195)。SEM 显示磨削后的 5Y-ZP/8Y-ZP 表面存在明显的表面缺陷。3Y-TZP 的磨削导致延性材料去除,从而导致最小的内聚材料损失。在所有组中,四步抛光方案导致的表面缺陷最少且最浅。上釉的 3Y-TZP 表面比 5Y-ZP/8Y-ZP 更均匀。
在所有研究材料中,使用四步抛光方案可获得最精细的表面光洁度。然而,对于磨削后的 5Y-ZP/8Y-ZP,由于磨削过程引起的明显表面损伤,该方案可能不适用。5Y-ZP/8Y-ZP 的上釉可能不如 3Y-TZP 那样可预测。
由于掺杂浓度的增加,更高的表面损伤敏感性可能使磨削后的半透明氧化锆的抛光比传统的 3Y-TZP 更复杂。