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长期稳定的黑磷晶体管的最新进展。

Recent advances in long-term stable black phosphorus transistors.

作者信息

Wan Da, Huang Hao, Wang Zhongzheng, Liu Xingqiang, Liao Lei

机构信息

School of Information Science and Engineering, Wuhan University of Science and Technology, Wuhan, 430081, China.

School of Physics and Technology, Wuhan University, Wuhan 430072, China.

出版信息

Nanoscale. 2020 Oct 15;12(39):20089-20099. doi: 10.1039/d0nr05204c.

Abstract

Two-dimensional black phosphorus (BP) presents extensive exciting properties attributed to the high mobility and non-dangling bonds uniform surface with simultaneously obtained atomically ultrathin body and offer opportunities beyond the traditional materials. BP has thus emerged as a unique material in the post-silicon era for low-power electronics and photo-electronics. Tremendous efforts have been invested in fully developing the extreme potentiality of BP for future nanoelectronics. However, the accompanying challenges, especially the poor stability that originates from the active surface, in fabricating large-area BP transistors with comparable electrical performance to silicon electronics prevent their practical application. Herein, we review the progress of recent works that demonstrated the feasibility of enhancing the stability of BP electronics, and identify the opportunities and challenges in developing BP as atomically thin semiconductors for next-generation nanoelectronics.

摘要

二维黑磷(BP)具有诸多令人兴奋的特性,这归因于其高迁移率、无悬键的均匀表面,同时具备原子级超薄的结构,为超越传统材料提供了机遇。因此,BP已成为后硅时代用于低功耗电子学和光电子学的独特材料。人们已投入巨大努力来充分挖掘BP在未来纳米电子学方面的巨大潜力。然而,在制造与硅电子产品具有相当电性能的大面积BP晶体管时,伴随而来的挑战,尤其是源于活性表面的稳定性差问题,阻碍了它们的实际应用。在此,我们回顾了近期工作的进展,这些工作证明了增强BP电子器件稳定性的可行性,并确定了将BP开发为用于下一代纳米电子学的原子级薄半导体时的机遇与挑战。

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