使用范德堡法测定电阻率和薄层电阻的简单分析方法。
Simple analytical method for determining electrical resistivity and sheet resistance using the van der Pauw procedure.
作者信息
Oliveira F S, Cipriano R B, da Silva F T, Romão E C, Dos Santos C A M
机构信息
Escola de Engenharia de Lorena, University of São Paulo, 12.602-810, Lorena, SP, Brazil.
出版信息
Sci Rep. 2020 Oct 2;10(1):16379. doi: 10.1038/s41598-020-72097-1.
This work reports an analytical method for determining electrical resistivity (ρ) and sheet resistance (R) of isotropic conductors. The method is compared with previous numerical solutions and available experimental data showing a universal behavior for isotropic conductors. An approximated solution is also reported allowing one to easily determine ρ and R for samples either with regular or arbitrary shapes.
这项工作报告了一种用于测定各向同性导体的电阻率（ρ）和薄层电阻（R）的分析方法。该方法与先前的数值解以及现有的实验数据进行了比较，结果表明各向同性导体具有普遍特性。文中还报告了一种近似解，可让人们轻松测定形状规则或任意的样品的ρ和R。
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