Kamalabadi Farzad, Qin Jianqi, Harding Brian J, Iliou Dimitrios, Makela Jonathan J, Meier R R, England Scott L, Frey Harald U, Mende Stephen B, Immel Thomas J
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1308 West Main Street, Urbana, IL 61801.
Space Sci Rev. 2018;214. doi: 10.1007/s11214-018-0502-9. Epub 2018 Apr 17.
The Ionospheric Connection Explorer (ICON) Far Ultraviolet (FUV) imager, ICON FUV, will measure altitude profiles of OI 135.6 nm emissions to infer nighttime ionospheric parameters. Accurate estimation of the ionospheric state requires the development of a comprehensive radiative transfer model from first principles to quantify the effects of physical processes on the production and transport of the 135.6 nm photons in the ionosphere including the mutual neutralization contribution as well as the effect of resonant scattering by atomic oxygen and pure absorption by oxygen molecules. This forward model is then used in conjunction with a constrained optimization algorithm to invert the anticipated ICON FUV line-of-sight integrated measurements. In this paper, we describe the connection between ICON FUV measurements and the nighttime ionosphere, along with the approach to inverting the measured emission profiles to derive the associated O profiles from 150-450 km in the nighttime ionosphere that directly reflect the electron density in the F-region of the ionosphere.
电离层连接探测器(ICON)远紫外(FUV)成像仪,即ICON FUV,将测量OI 135.6纳米发射的高度剖面,以推断夜间电离层参数。准确估计电离层状态需要从第一原理开发一个综合辐射传输模型,以量化物理过程对电离层中135.6纳米光子的产生和传输的影响,包括相互中和贡献以及原子氧的共振散射效应和氧分子的纯吸收效应。然后,这个正向模型与约束优化算法结合使用,以反演预期的ICON FUV视线积分测量结果。在本文中,我们描述了ICON FUV测量与夜间电离层之间的联系,以及反演测量发射剖面以从夜间电离层150 - 450公里处推导相关O剖面的方法,这些剖面直接反映了电离层F区的电子密度。