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功能器件与系统的层尺度和芯片尺度转移技术综述

Layer-Scale and Chip-Scale Transfer Techniques for Functional Devices and Systems: A Review.

作者信息

Gong Zheng

机构信息

Institute of Semiconductors, Guangdong Academy of Sciences, No. 363 Changxing Road, Tianhe District, Guangzhou 510650, China.

Foshan Debao Display Technology Co Ltd., Room 508-1, Level 5, Block A, Golden Valley Optoelectronics, Nanhai District, Foshan 528200, China.

出版信息

Nanomaterials (Basel). 2021 Mar 25;11(4):842. doi: 10.3390/nano11040842.

DOI:10.3390/nano11040842
PMID:33806237
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8065746/
Abstract

Hetero-integration of functional semiconductor layers and devices has received strong research interest from both academia and industry. While conventional techniques such as pick-and-place and wafer bonding can partially address this challenge, a variety of new layer transfer and chip-scale transfer technologies have been developed. In this review, we summarize such transfer techniques for heterogeneous integration of ultrathin semiconductor layers or chips to a receiving substrate for many applications, such as microdisplays and flexible electronics. We showed that a wide range of materials, devices, and systems with expanded functionalities and improved performance can be demonstrated by using these technologies. Finally, we give a detailed analysis of the advantages and disadvantages of these techniques, and discuss the future research directions of layer transfer and chip transfer techniques.

摘要

功能性半导体层与器件的异质集成已引起学术界和工业界的浓厚研究兴趣。虽然诸如拾取和放置以及晶圆键合等传统技术可以部分应对这一挑战,但已开发出多种新的层转移和芯片级转移技术。在本综述中,我们总结了此类用于将超薄半导体层或芯片异质集成到接收基板以用于许多应用(如微显示器和柔性电子器件)的转移技术。我们表明,通过使用这些技术可以展示出具有扩展功能和改进性能的广泛材料、器件和系统。最后,我们对这些技术的优缺点进行了详细分析,并讨论了层转移和芯片转移技术的未来研究方向。

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