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一种用于MEMS振动陀螺仪的实时电路相位延迟校正系统。

A Real-Time Circuit Phase Delay Correction System for MEMS Vibratory Gyroscopes.

作者信息

Xu Pengfei, Wei Zhenyu, Guo Zhiyu, Jia Lu, Han Guowei, Si Chaowei, Ning Jin, Yang Fuhua

机构信息

Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.

College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China.

出版信息

Micromachines (Basel). 2021 Apr 30;12(5):506. doi: 10.3390/mi12050506.

DOI:10.3390/mi12050506
PMID:33946535
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8147202/
Abstract

With the development of the designing and manufacturing level for micro-electromechanical system (MEMS) gyroscopes, the control circuit system has become a key point to determine their internal performance. Nevertheless, the phase delay of electronic components may result in some serious hazards. This study described a real-time circuit phase delay correction system for MEMS vibratory gyroscopes. A detailed theoretical analysis was provided to clarify the influence of circuit phase delay on the in-phase and quadrature (IQ) coupling characteristics and the zero-rate output (ZRO) utilizing a force-to-rebalance (FTR) closed-loop detection and quadrature correction system. By deducing the relationship between the amplitude-frequency, the phase-frequency of the MEMS gyroscope, and the phase relationship of the whole control loop, a real-time correction system was proposed to automatically adjust the phase reference value of the phase-locked loop (PLL) and thus compensate for the real-time circuit phase delay. The experimental results showed that the correction system can accurately measure and compensate the circuit phase delay in real time. Furthermore, the unwanted IQ coupling can be eliminated and the ZRO was decreased by 755% to 0.095°/s. This correction system realized a small angle random walk of 0.978°/√h and a low bias instability of 9.458°/h together with a scale factor nonlinearity of 255 ppm at room temperature. The thermal drift of the ZRO was reduced to 0.0034°/s/°C at a temperature range from -20 to 70 °C.

摘要

随着微机电系统(MEMS)陀螺仪设计与制造水平的发展,控制电路系统已成为决定其内部性能的关键因素。然而,电子元件的相位延迟可能会导致一些严重问题。本研究描述了一种用于MEMS振动陀螺仪的实时电路相位延迟校正系统。通过力平衡(FTR)闭环检测和正交校正系统,进行了详细的理论分析,以阐明电路相位延迟对同相和正交(IQ)耦合特性以及零速率输出(ZRO)的影响。通过推导MEMS陀螺仪的幅频、相频之间的关系以及整个控制回路的相位关系,提出了一种实时校正系统,以自动调整锁相环(PLL)的相位参考值,从而补偿实时电路相位延迟。实验结果表明,该校正系统能够实时准确地测量和补偿电路相位延迟。此外,还可以消除不必要的IQ耦合,ZRO降低了755%,至0.095°/s。该校正系统在室温下实现了0.978°/√h的小角度随机游走、9.458°/h的低偏置不稳定性以及255 ppm的比例因子非线性。在-20至70°C的温度范围内,ZRO的热漂移降低至0.0034°/s/°C。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/db78/8147202/4ce08c489e76/micromachines-12-00506-g014.jpg
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