Woicik J C, Weiland C, Rumaiz A K, Brumbach M T, Ablett J M, Shirley E L, Kas J J, Rehr J J
Material Measurement Science Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA.
Phys Rev B. 2020 Jun;101(24). doi: 10.1103/physrevb.101.245105.
Electron-core hole interactions are critical for proper interpretation of core-level spectroscopies commonly used as analytical tools in materials science. Here we utilize resonant Auger-electron spectroscopy to uniquely identify exciton, shake, and charge-transfer processes that result from the sudden creation of the core hole in both x-ray-absorption and photoemission spectra. These effects are captured for the transition-metal compounds SrTiO and MoS by fully , combined real-time cumulant, and Bethe-Salpeter equation approaches to account for core hole dynamics and screening. Atomic charges and excited-state electron-density fluctuations reflect materials' solid-state electronic structure, loss of translational symmetry around the core hole, and breakdown of the sudden approximation. They also demonstrate competition between long- and short-range screening in a solid.
电子-芯孔相互作用对于正确解释材料科学中常用作分析工具的芯能级光谱至关重要。在这里,我们利用共振俄歇电子能谱来唯一地识别在X射线吸收和光电子能谱中由芯孔的突然产生所导致的激子、振动和电荷转移过程。通过完全结合实时累积量和贝特-萨尔皮特方程方法来考虑芯孔动力学和屏蔽,对过渡金属化合物SrTiO和MoS₂捕获了这些效应。原子电荷和激发态电子密度波动反映了材料的固态电子结构、芯孔周围平移对称性的丧失以及突然近似的失效。它们还展示了固体中长程和短程屏蔽之间的竞争。