Cheng Biyao, Yang Shuming, Li Wei, Li Shi, Shafique Shareen, Wu Dong, Ji Shengyun, Sun Yu, Jiang Zhuangde
State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, 710049 China.
National Institute of Metrology, Beijing, 102200 China.
Microsyst Nanoeng. 2021 Oct 15;7:80. doi: 10.1038/s41378-021-00310-w. eCollection 2021.
Carbon nanotubes (CNTs) can be used as atomic force microscopy (AFM) tips for high-resolution scanning due to their small diameter, high aspect ratio and outstanding wear resistance. However, previous approaches for fabricating CNT probes are complex and poorly controlled. In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. We used the CNT probe to scan the complex nanostructure with a high aspect ratio, thereby solving the long-lasting problem of mapping complex nanostructures.
碳纳米管（CNTs）由于其小直径、高纵横比和出色的耐磨性，可作为原子力显微镜（AFM）的尖端用于高分辨率扫描。然而，以前制造碳纳米管探针的方法复杂且控制不佳。在本文中，我们介绍了一种简单的方法，通过控制触发阈值来调整附着在尖端的生长溶液量，从而在AFM尖端上选择性地制造单个碳纳米管。产率超过93%。所得的碳纳米管探针长度合适，无需后续切割工艺。我们使用碳纳米管探针扫描具有高纵横比的复杂纳米结构，从而解决了绘制复杂纳米结构这一长期存在的问题。
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