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具有热氧化Al₂Ga₂O₄侧壁的基于AlGaN的深紫外发光二极管。

AlGaN-Based Deep Ultraviolet Light-Emitting Diodes with Thermally Oxidized Al Ga O Sidewalls.

作者信息

Wang Tien-Yu, Lai Wei-Chih, Sie Syuan-Yu, Chang Sheng-Po, Kuo Cheng-Huang, Sheu Jinn-Kong, Bow Jong-Shing

机构信息

Department of Photonics, National Cheng Kung University, Tainan 70101, Taiwan.

Advanced Optoelectronic Technology Center, Research Center for Energy Technology and Strategy, National Cheng Kung University, Tainan 70101, Taiwan.

出版信息

ACS Omega. 2022 Apr 20;7(17):15027-15036. doi: 10.1021/acsomega.2c00813. eCollection 2022 May 3.

Abstract

AlGaN and GaN sidewalls were turned into Al Ga O and GaO, respectively, by thermal oxidation to improve the optoelectrical characteristics of deep ultraviolet (DUV) light-emitting diodes (LEDs). The thermally oxidized GaO is a single crystal with nanosized voids homogenously distributed inside the layer. Two oxidized Al Ga O layers were observed on the sidewall of the AlGaN layer in transmission electron microscopy images. The first oxidized Al Ga O layer is a single crystal, while the second oxidized Al GaO layer is a single crystal with numerous nanosized voids inside. The composition of Al in the first oxidized Al Ga O layer is higher than that in the second one. The thermal oxidation at high temperature degrades the quality of the p-GaN layer and increases the forward voltage from 8.18 to 11.36 V. The thermally oxidized Al Ga O sidewall greatly enhances the light extraction efficiency of the lateral light of the DUV LEDs by combined mechanisms of holey structure, graded refractive index, high transparency, and tensile stress. Consequently, the light output power of the DUV LEDs increases from 0.69 to 0.88 mW by introducing a 420 nm thick Al Ga O sidewall oxidized at 900 °C, in which the enhancement of light output power can reach 27.5%.

摘要

通过热氧化将AlGaN和GaN侧壁分别转变为AlₓGa₁₋ₓO和GaO,以改善深紫外(DUV)发光二极管(LED)的光电特性。热氧化后的GaO是一种单晶,层内均匀分布着纳米尺寸的空洞。在透射电子显微镜图像中,在AlGaN层的侧壁上观察到两个氧化的AlₓGa₁₋ₓO层。第一个氧化的AlₓGa₁₋ₓO层是单晶,而第二个氧化的AlₓGa₁₋ₓO层是内部有大量纳米尺寸空洞的单晶。第一个氧化的AlₓGa₁₋ₓO层中Al的成分高于第二个。高温下的热氧化会降低p-GaN层的质量,并使正向电压从8.18 V增加到11.36 V。热氧化的AlₓGa₁₋ₓO侧壁通过多孔结构、渐变折射率、高透明度和拉伸应力等综合机制极大地提高了DUV LED侧向光的光提取效率。因此,通过引入在900°C下氧化的420 nm厚的AlₓGa₁₋ₓO侧壁,DUV LED的光输出功率从0.69 mW增加到0.88 mW,其中光输出功率的增强可达27.5%。

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