Lai Chun-Feng, Tien Yu-Chien, Tong Hung-Chun, Zhong Chang-Zhi, Lee Yu-Chun
Department of Photonics, Feng Chia University No. 100, Wenhwa Road, Seatwen Taichung 40724 Taiwan
Lextar Electronics Corp., Hsinchu Science Park Hsinchu 30075 Taiwan.
RSC Adv. 2018 Oct 22;8(63):35966-35972. doi: 10.1039/c8ra07928e.
High reliability and wide color gamut light-emitting diodes (LEDs) that use composite quantum dot films (CQDFs) protected by chip-scale package (CSP) structures are presented. CQDFs containing CdZnSeS/ZnS core-shell QDs and the KSiF:Mn phosphors were mixed with silicone gel and used as color converters in the CSP QD-LEDs. The CSP QD-LEDs, used for backlight displays, transmitted through a color filter and exhibited ITU-R Recommendation BT.2020 of approximately 86% (a National Television System Committee value of 115%). Furthermore, we performed a long-term reliability analysis test on the CSP QD-LEDs for 2352 h to verify whether the optical performance of CSP QD-LEDs does not significantly degrade relative to that of a conventional plastic leaded chip carrier QD-LEDs. We implemented a highly reliable package technology that can protect the QDs, solve the moisture/oxygen problems in defective QD-LEDs, and produce a backlight source for display with a wide color gamut.
本文介绍了一种采用芯片级封装(CSP)结构保护的复合量子点薄膜(CQDF)的高可靠性和广色域发光二极管(LED)。将含有CdZnSeS/ZnS核壳量子点和KSiF:Mn荧光粉的CQDF与硅胶混合,并用作CSP量子点发光二极管中的颜色转换器。用于背光显示器的CSP量子点发光二极管透过彩色滤光片后,显示出约86%的ITU-R BT.2020推荐值(国家电视系统委员会值为115%)。此外,我们对CSP量子点发光二极管进行了2352小时的长期可靠性分析测试,以验证CSP量子点发光二极管的光学性能相对于传统塑料引脚芯片载体量子点发光二极管是否不会显著下降。我们实现了一种高度可靠的封装技术,该技术可以保护量子点,解决有缺陷的量子点发光二极管中的水分/氧气问题,并生产出用于广色域显示器的背光源。