Zhou Shaohua, Yang Cheng, Wang Jian
School of Microelectronics, Tianjin University, Tianjin 300072, China.
Qingdao Institute for Ocean Technology, Tianjin University, Qingdao 266200, China.
Micromachines (Basel). 2022 Apr 28;13(5):693. doi: 10.3390/mi13050693.
The amplifier is a key component of the radio frequency (RF) front-end, and its specifications directly determine the performance of the system in which it is located. Unfortunately, amplifiers' specifications degrade with temperature and even lead to system failure. To study how the system failure is affected by the amplifier specification degradation, it is necessary to couple the amplifier specification degradation into the system optimization design. Furthermore, to couple the amplifier specification degradation into the optimal design of the system, it is necessary to model the characteristics of the amplifier specification change with temperature. In this paper, the temperature characteristics of two amplifiers are modeled using an extreme learning machine (ELM), and the results show that the model agrees well with the measurement results and can effectively reduce measurement time and cost.
放大器是射频(RF)前端的关键组件,其规格直接决定了它所在系统的性能。不幸的是,放大器的规格会随温度降低,甚至导致系统故障。为了研究系统故障如何受到放大器规格退化的影响,有必要将放大器规格退化纳入系统优化设计中。此外,为了将放大器规格退化纳入系统的优化设计,有必要对放大器规格随温度变化的特性进行建模。本文使用极限学习机(ELM)对两个放大器的温度特性进行建模,结果表明该模型与测量结果吻合良好,能够有效减少测量时间和成本。