Plant G T, Hess R F, Thomas S J
Brain. 1986 Jun;109 ( Pt 3):469-90. doi: 10.1093/brain/109.3.469.
The electroretinogram (ERG) and the occipital visual evoked potential (VEP) evoked by sinusoidal grating stimuli have been recorded in cases with a past history of optic neuritis. Although a significant reduction in pattern ERG amplitude was found in the patient group there was considerable overlap between the patient and the control populations. The pattern ERG was not found to be a sensitive test in providing evidence of a previous attack of optic neuritis. Reduction in VEP amplitude was considerably greater than was the reduction in ERG amplitude. The residual visual deficit in the patients was quantified by measuring contrast sensitivity. Overall, the greater the residual deficit the greater was the ERG abnormality, but in some individual patients it was found that the contrast sensitivity loss and the ERG amplitude reduction were not well correlated. No evidence was found for a latency change peripheral to the generators of the pattern ERG which might contribute to the VEP latency changes which occur following an attack of optic neuritis.
对有视神经炎病史的患者记录了由正弦光栅刺激诱发的视网膜电图（ERG）和枕叶视觉诱发电位（VEP）。虽然在患者组中发现图形ERG振幅显著降低，但患者群体与对照组之间存在相当大的重叠。未发现图形ERG是提供既往视神经炎发作证据的敏感测试。VEP振幅的降低比ERG振幅的降低要大得多。通过测量对比敏感度对患者的残余视力缺陷进行量化。总体而言，残余缺陷越大，ERG异常就越严重，但在一些个体患者中发现，对比敏感度损失与ERG振幅降低之间没有很好的相关性。未发现有证据表明图形ERG发生器外周的潜伏期变化可能导致视神经炎发作后出现的VEP潜伏期变化。
