Centre National D'Etudes Spatiales (CNES), 18 Avenue Edouard Belin, 31400 Toulouse, France.
Department of Electronics, Optronics and Signal Processing (DEOS), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), 10 Avenue Edouard Belin, 31400 Toulouse, France.
Sensors (Basel). 2023 Jun 25;23(13):5884. doi: 10.3390/s23135884.
For the last two decades, the CNES optoelectronics detection department and partners have evaluated space environment effects on a large panel of CMOS image sensors (CIS) from a wide range of commercial foundries and device providers. Many environmental tests have been realized in order to provide insights into detection chain degradation in modern CIS for space applications. CIS technology has drastically improved in the last decade, reaching very high performances in terms of quantum efficiency (QE) and spectral selectivity. These improvements are obtained thanks to the introduction of various components in the pixel optical stack, such as microlenses, color filters, and polarizing filters. However, since these parts have been developed only for commercial applications suitable for on-ground environment, it is crucial to evaluate if these technologies can handle space environments for future space imaging missions. There are few results on that robustness in the literature. The objective of this article is to give an overview of CNES and partner experiments from numerous works, showing that the performance gain from the optical stack is greater than the degradation induced by the space environment. Consequently, optical stacks can be used for space missions because they are not the main contributor to the degradation in the detection chain.
在过去的二十年中,CNES 光电检测部门和合作伙伴评估了来自广泛商业代工厂和设备供应商的大量 CMOS 图像传感器 (CIS) 的空间环境效应。为了深入了解现代 CIS 在空间应用中的检测链退化,已经进行了许多环境测试。在过去的十年中,CIS 技术得到了极大的改进,在量子效率 (QE) 和光谱选择性方面达到了非常高的性能。这些改进是通过在像素光学堆叠中引入各种组件实现的,例如微透镜、滤色片和偏光片。然而,由于这些部件仅为适用于地面环境的商业应用而开发,因此必须评估这些技术是否能够应对未来空间成像任务的空间环境。文献中关于这种鲁棒性的结果很少。本文的目的是概述 CNES 和合作伙伴在众多工作中的实验,结果表明光学堆叠的性能增益大于空间环境引起的退化。因此,光学堆叠可用于空间任务,因为它们不是导致检测链退化的主要因素。