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高熵合金薄膜在模拟体液中的结构参数与行为

Structural Parameters and Behavior in Simulated Body Fluid of High Entropy Alloy Thin Films.

作者信息

Craciun Doina, Laszlo Edwin A, Mirza-Rosca Julia C, Dorcioman Gabriela, Geanta Victor, Voiculescu Ionelia, Craciun Gabriel, Badea Liviu, Craciun Valentin

机构信息

National Institute for Laser, Plasma and Radiation Physics, 077125 Măgurele, Romania.

Faculty of Physics, Doctoral School of Physics, University of Bucharest, 077125 Măgurele, Romania.

出版信息

Materials (Basel). 2024 Mar 1;17(5):1162. doi: 10.3390/ma17051162.

Abstract

The structure, composition and corrosion properties of thin films synthesized using the Pulsed Laser Deposition (PLD) technique starting from a three high entropy alloy (HEA) AlCoCrFeNix produced by vacuum arc remelting (VAR) method were investigated. The depositions were performed at room temperature on Si and mirror-like polished Ti substrates either under residual vacuum (low 10 mbar, films denoted HEA2, HEA6, and HEA10, which were grown from targets with Ni concentration molar ratio, x, equal to 0.4, 1.2, and 2.0, respectively) or under N (10 mbar, films denoted HEN2, HEN6, and HEN10 for the same Ni concentration molar ratios). The deposited films' structures, investigated using Grazing Incidence X-ray Diffraction, showed the presence of face-centered cubic and body-centered cubic phases, while their surface morphology, investigated using scanning electron microscopy, exhibited a smooth surface with micrometer size droplets. The mass density and thickness were obtained from simulations of acquired X-ray reflectivity curves. The films' elemental composition, estimated using the energy dispersion X-ray spectroscopy, was quite close to that of the targets used. X-ray Photoelectron Spectroscopy investigation showed that films deposited under a N atmosphere contained several percentages of N atoms in metallic nitride compounds. The electrochemical behavior of films under simulated body fluid (SBF) conditions was investigated by Open Circuit Potential (OCP) and Electrochemical Impedance Spectroscopy measurements. The measured OCP values increased over time, implying that a passive layer was formed on the surface of the films. It was observed that all films started to passivate in SBF solution, with the HEN6 film exhibiting the highest increase. The highest repassivation potential was exhibited by the same film, implying that it had the highest stability range of all analyzed films. Impedance measurements indicated high corrosion resistance values for HEA2, HEA6, and HEN6 samples. Much lower resistances were found for HEN10 and HEN2. Overall, HEN6 films exhibited the best corrosion behavior among the investigated films. It was noticed that for 24 h of immersion in SBF solution, this film was also a physical barrier to the corrosion process, not only a chemical one.

摘要

研究了采用脉冲激光沉积(PLD)技术,以通过真空电弧重熔(VAR)法制备的三元高熵合金(HEA)AlCoCrFeNix为原料合成的薄膜的结构、组成和腐蚀性能。在室温下,在Si和镜面抛光的Ti衬底上进行沉积,沉积过程分别在残余真空(低至10毫巴,薄膜标记为HEA2、HEA6和HEA10,它们分别由镍浓度摩尔比x等于0.4、1.2和2.0的靶材生长而成)或氮气(10毫巴,对于相同的镍浓度摩尔比,薄膜标记为HEN2、HEN6和HEN10)环境下进行。使用掠入射X射线衍射对沉积薄膜的结构进行研究,结果表明存在面心立方相和体心立方相;使用扫描电子显微镜对其表面形貌进行研究,结果显示表面光滑,有微米级尺寸的液滴。通过对采集的X射线反射率曲线进行模拟获得质量密度和厚度。使用能量色散X射线光谱法估算薄膜的元素组成,结果与所用靶材的元素组成非常接近。X射线光电子能谱研究表明,在氮气气氛下沉积的薄膜在金属氮化物化合物中含有若干百分比的氮原子。通过开路电位(OCP)和电化学阻抗谱测量研究了薄膜在模拟体液(SBF)条件下的电化学行为。测得的OCP值随时间增加,这意味着在薄膜表面形成了钝化层。观察到所有薄膜在SBF溶液中都开始钝化,其中HEN6薄膜的增加幅度最大。同一薄膜表现出最高的再钝化电位,这意味着它在所有分析薄膜中具有最高的稳定范围。阻抗测量表明,HEA2、HEA6和HEN6样品具有高耐腐蚀性值。HEN10和HEN2的电阻则低得多。总体而言,HEN6薄膜在所研究的薄膜中表现出最佳的腐蚀行为。值得注意的是,在SBF溶液中浸泡24小时后,该薄膜不仅是腐蚀过程的化学屏障,也是物理屏障。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d678/10934186/c83884d52d0b/materials-17-01162-g001.jpg

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