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碳离子放疗后次级粒子对心脏植入电子设备软错误的影响

The Contribution of Secondary Particles Following Carbon Ion Radiotherapy to Soft Errors in CIEDs.

作者信息

Kawakami Yudai, Sakai Makoto, Masuda Hiroaki, Miyajima Masami, Kanzaki Takao, Kobayashi Kazutoshi, Ohno Tatsuya, Sakurai Hiroshi

机构信息

Graduate School of Science and Technology, Gunma University Kiryu 376-8515 Japan.

Gunma University Heavy Ion Medical Center Maebashi 371-8511 Japan.

出版信息

IEEE Open J Eng Med Biol. 2024 Jan 26;5:157-162. doi: 10.1109/OJEMB.2024.3358989. eCollection 2024.

Abstract

While carbon ion radiotherapy is highly effective in cancer treatment, it has a high risk of causing soft error, which leads to malfunctions in cardiac implantable electrical devices (CIEDs). To predict the risk of malfunction prior to treatment, it is necessary to measure the reaction cross-sections and contributions to the soft error of secondary particles generated during treatments. A field-programmable gate array was used instead of CIEDs to measure soft errors by varying the energy spectrum of secondary particles. The reaction cross-sections measured for each secondary particle were 3.0 × 10, 2.0 × 10, 1.3 × 10, and 1.5 × 10 [cm/Mb] for thermal neutrons, intermediate-energy neutrons, high-energy neutrons above 10 MeV, and protons, respectively. The contribution of high-energy neutrons was the largest among them. Our study indicates that to reduce the risk of soft errors, secure distance and appropriate irradiation directions are necessary.

摘要

虽然碳离子放射疗法在癌症治疗中非常有效,但它有很高的导致软错误的风险,这会导致心脏植入式电子设备(CIED)出现故障。为了在治疗前预测故障风险,有必要测量治疗期间产生的次级粒子的反应截面及其对软错误的贡献。使用现场可编程门阵列代替CIED,通过改变次级粒子的能谱来测量软错误。对于热中子、中能中子、能量高于10 MeV的高能中子和质子,测量得到的每个次级粒子的反应截面分别为3.0×10、2.0×10、1.3×10和1.5×10 [cm/Mb]。其中高能中子的贡献最大。我们的研究表明,为了降低软错误的风险,需要确保安全距离和合适的照射方向。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/418a/10939317/a52f72c13626/sakai1-3358989.jpg

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