Liang Wenqian, Wei Wenqi, Han Dong, Ming Ming, Zhang Jieyin, Wang Zihao, Zhang Xinding, Wang Ting, Zhang Jianjun
School of Physics, South China Normal University, Guangzhou 510631, China.
Songshan Lake Materials Laboratory, Dongguan 523808, China.
Materials (Basel). 2024 Apr 21;17(8):1916. doi: 10.3390/ma17081916.
The direct growth of III-V quantum dot (QD) lasers on silicon substrate has been rapidly developing over the past decade and has been recognized as a promising method for achieving on-chip light sources in photonic integrated circuits (PICs). Up to date, O- and C/L-bands InAs QD lasers on Si have been extensively investigated, but as an extended telecommunication wavelength, the E-band QD lasers directly grown on Si substrates are not available yet. Here, we demonstrate the first E-band (1365 nm) InAs QD micro-disk lasers epitaxially grown on Si (001) substrates by using a III-V/IV hybrid dual-chamber molecular beam epitaxy (MBE) system. The micro-disk laser device on Si was characterized with an optical threshold power of 0.424 mW and quality factor (Q) of 1727.2 at 200 K. The results presented here indicate a path to on-chip silicon photonic telecom-transmitters.
在过去十年中,III-V族量子点(QD)激光器在硅衬底上的直接生长技术发展迅速,并且已被公认为是在光子集成电路(PIC)中实现片上光源的一种很有前景的方法。到目前为止,硅基上的O波段和C/L波段砷化铟量子点激光器已得到广泛研究,但作为一个扩展的电信波长,直接生长在硅衬底上的E波段量子点激光器尚未问世。在此,我们展示了首个通过使用III-V/IV混合双腔分子束外延(MBE)系统在硅(001)衬底上外延生长的E波段(1365纳米)砷化铟量子点微盘激光器。硅基微盘激光器件在200K温度下的光学阈值功率为0.424毫瓦,品质因数(Q)为1727.2。本文给出的结果为片上硅光子电信发射器指明了一条道路。