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不同材料压痕尺寸效应模型的比较研究。

A comparative study of indentation size effect models for different materials.

作者信息

Wang Peina, Gao Yu, Wang Peihuan

机构信息

Department of Stomatology, Xi'an No. 3 Hospital, The Affiliated Hospital of Northwest University, Xi'an, 710018, Shaanxi, China.

Department of Pediatric Dentistry, School and Hospital of Stomatology, Shandong University & Shandong Key Laboratory of Oral Tissue Regeneration & Shandong Engineering Research Center of Dental Materials and Oral Tissue Regeneration & Shandong Provincial Clinical Research Center for Oral Diseases, Cheeloo College of Medicine, Jinan, 250012, Shandong, China.

出版信息

Sci Rep. 2024 Aug 28;14(1):20010. doi: 10.1038/s41598-024-71136-5.

DOI:10.1038/s41598-024-71136-5
PMID:39198697
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11358371/
Abstract

The phenomenon of indentation size effect (ISE) has received great attention in aerospace, nuclear power, microelectronics and medicine. Although researchers have proposed various ISE models, these models often involve different form and number of parameters that can make our wonder which is the best in existed ISE models. Herein, three types of ISE test data, namely, normal ISE, reverse ISE and transition of normal to reverse ISE, are used to evaluate the sixteen ISE models. The comparatively study indicates that Hou-Jennet(H-J), Nix-Gao-Feng (N-G-Fs), Nix-Gao-Haušild (N-G-H), Nix-Gao-Abu Al-Rub (N-G-A) and Nix-Gao-Qius (N-G-Qs) models can accurately predict the normal ISE. The reason for this is that the friction stress that is not related to dislocation activities or the indentation size effect of plastic zone has been introduced into these models. Therefore, these two factors should be considered in future ISE models. The sixteen ISE models are originally proposed to describe the normal ISE of different materials. However, to our surprise, some of these models are able to capture the reverse ISE and the transition of normal to reverse ISE of different materials. The determination coefficients (DC) of the sixteen ISE models are also determined for different materials. For reverse ISE, the highest DC value for Ni Carbide Silicon (NiCSi), TC4 titanium alloy (TC4) and Pulsed electro-deposited Ni (PED Ni) are given by the Exponential (EXP), Nix-Gao-Feng (N-G-Fs) and Nix-Gao-Abu Al-Rub (N-G-A) models, respectively. For the transition of normal to reverse ISE, the Nix-Gao-Yuan-Chen (N-G-YC), Nix-Gao-Feng (N-G-Fs), and Nix-Gao-Haušild (N-G-H) models produce the maximum DC for ZrO ceramic (ZrO), Cu single crystals (Cu) and YO-ZrO ceramic (YO-ZrO), respectively. Moreover, the mean DC of the Nix-Gao-Feng (N-G-Fs) model is the maximum among the sixteen ISE models, followed by the Nix-Gao-Haušild (N-G-H) model, but they cannot accurately predict the reverse ISE. Therefore, the Nix-Gao-Feng (N-G-Fs) and Nix-Gao-Haušild (N-G-H) models should be further modified to accurately predict the reverse ISE.

摘要

压痕尺寸效应(ISE)现象在航空航天、核电、微电子和医学领域受到了广泛关注。尽管研究人员提出了各种ISE模型,但这些模型通常涉及不同形式和数量的参数,这不禁让人思考在现有的ISE模型中哪种是最佳的。在此,使用三种类型的ISE测试数据,即正常ISE、反向ISE以及从正常ISE到反向ISE的转变,来评估16种ISE模型。对比研究表明,侯 - 杰内特(H - J)、尼克斯 - 高 - 冯(N - G - Fs)、尼克斯 - 高 - 豪希尔德(N - G - H)、尼克斯 - 高 - 阿布·阿尔 - 鲁布(N - G - A)和尼克斯 - 高 - 邱斯(N - G - Qs)模型能够准确预测正常ISE。原因在于这些模型引入了与位错活动无关的摩擦应力或塑性区的压痕尺寸效应。因此,在未来的ISE模型中应考虑这两个因素。这16种ISE模型最初是为描述不同材料的正常ISE而提出的。然而,令人惊讶的是,其中一些模型能够捕捉不同材料的反向ISE以及从正常ISE到反向ISE的转变。还针对不同材料确定了这16种ISE模型的决定系数(DC)。对于反向ISE,碳化镍硅(NiCSi)、TC4钛合金(TC4)和脉冲电沉积镍(PED Ni)的最高DC值分别由指数(EXP)、尼克斯 - 高 - 冯(N - G - Fs)和尼克斯 - 高 - 阿布·阿尔 - 鲁布(N - G - A)模型给出。对于从正常ISE到反向ISE的转变,尼克斯 - 高 - 袁 - 陈(N - G - YC)、尼克斯 - 高 - 冯(N - G - Fs)和尼克斯 - 高 - 豪希尔德(N - G - H)模型分别为氧化锆陶瓷(ZrO)、铜单晶(Cu)和钇 - 氧化锆陶瓷(YO - ZrO)产生了最大DC值。此外,尼克斯 - 高 - 冯(N - G - Fs)模型的平均DC在这16种ISE模型中是最大的,其次是尼克斯 - 高 - 豪希尔德(N - G - H)模型,但它们不能准确预测反向ISE。因此,尼克斯 - 高 - 冯(N - G - Fs)和尼克斯 - 高 - 豪希尔德(N - G - H)模型应进一步修改以准确预测反向ISE。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/f47ab8bd79cb/41598_2024_71136_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/ce6766cea815/41598_2024_71136_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/21b989114ae7/41598_2024_71136_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/0df8e4c56b57/41598_2024_71136_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/f47ab8bd79cb/41598_2024_71136_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/ce6766cea815/41598_2024_71136_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/21b989114ae7/41598_2024_71136_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/0df8e4c56b57/41598_2024_71136_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1287/11358371/f47ab8bd79cb/41598_2024_71136_Fig4_HTML.jpg

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