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二维过渡金属二硫属化物(2H、1T和1T'相)的缺陷相关电子性质。

Defect dependent electronic properties of two-dimensional transition metal dichalcogenides (2H, 1T, and 1T' phases).

作者信息

Hanedar Berna Akgenc, Onbaşlı Mehmet Cengiz

机构信息

Department of Physics, Kirklareli University, Kirklareli, 39100, Turkey.

Department of Physics, Koc University, Rumelifeneri Yolu, Sariyer 34450, Istanbul, Turkey.

出版信息

Phys Chem Chem Phys. 2025 Jan 22;27(4):1809-1818. doi: 10.1039/d4cp04017a.

DOI:10.1039/d4cp04017a
PMID:39692347
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11698123/
Abstract

Transition metal dichalcogenides (TMDs) exhibit a wide range of electronic properties due to their structural diversity. Understanding their defect-dependent properties might enable the design of efficient, bright, and long-lifetime quantum emitters. Here, we use density functional theory (DFT) calculations to investigate the 2H, 1T, and 1T' phases of MoS, WS, MoSe, WSe and the effect of defect densities on the electronic band structures, focusing on the influence of chalcogen vacancies. The 2H phase, which is thermodynamically stable, is a direct band gap semiconductor, while the 1T phase, despite its higher formation energy, exhibits metallic behavior. 1T phases with spin-orbit coupling show significant band inversions of 0.61, 0.77, 0.24 and 0.78 eV for MoS, MoSe, WS and WSe, respectively. We discovered that for all four MX systems, the energy difference between 2H, 1T and 1T phases decreases with increasing concentration of vacancies (from 3.13% to 21.88%). Our findings show that the 2H phase also has minimum energy values depending on vacancies. TMDs containing W were found to have a wider bandgap compared to those containing Mo. The band gap of 2H WS decreased from 1.81 eV (1.54 eV with SOC included) under GGA calculations to a range of 1.37 eV to 0.79 eV, while the band gap of 2H MoSe reduced from 1.43 eV (1.31 eV with SOC) under GGA to a range of 0.98 eV to 0.06 eV, depending on the concentration. Our findings provide guidelines for experimental screening of 2D TMD defects, paving the way for the development of next-generation spintronic, electronic, and optoelectronic devices.

摘要

过渡金属二硫属化物(TMDs)因其结构多样性而展现出广泛的电子特性。了解它们与缺陷相关的特性可能有助于设计高效、明亮且寿命长的量子发射器。在此,我们使用密度泛函理论(DFT)计算来研究MoS、WS、MoSe、WSe的2H、1T和1T'相以及缺陷密度对电子能带结构的影响,重点关注硫属元素空位的影响。热力学稳定的2H相是直接带隙半导体,而1T相尽管形成能较高,但表现出金属行为。具有自旋轨道耦合的1T相对于MoS、MoSe、WS和WSe分别显示出0.61、0.77、0.24和0.78 eV的显著能带反转。我们发现,对于所有四个MX系统,2H、1T和1T相之间的能量差随着空位浓度的增加而减小(从3.13%到21.88%)。我们的研究结果表明,2H相也具有取决于空位的最小能量值。发现含W的TMDs比含Mo的TMDs具有更宽的带隙。2H WS的带隙在GGA计算下从1.81 eV(包含SOC时为1.54 eV)降低到1.37 eV至0.79 eV的范围,而2H MoSe的带隙在GGA下从1.43 eV(含SOC时为1.31 eV)降低到0.98 eV至0.06 eV的范围,具体取决于浓度。我们的研究结果为二维TMD缺陷的实验筛选提供了指导方针,为下一代自旋电子、电子和光电器件的发展铺平了道路。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/1751ad8c971c/d4cp04017a-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/38205d2df74a/d4cp04017a-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/c006e60644d8/d4cp04017a-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/dbe9581459fb/d4cp04017a-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/1751ad8c971c/d4cp04017a-f4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/38205d2df74a/d4cp04017a-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/c006e60644d8/d4cp04017a-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/dbe9581459fb/d4cp04017a-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/78b9/11698123/1751ad8c971c/d4cp04017a-f4.jpg

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