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等离子体p-CuS/CdS异质结处的直接和间接界面电子转移

Direct and Indirect Interfacial Electron Transfer at a Plasmonic p-CuS/CdS Heterojunction.

作者信息

Yang Zhicheng, Ghorai Nandan, Wu Shengxiang, He Sheng, Lian Tianquan

机构信息

Department of Chemistry, Emory University, Atlanta, Georgia 30322, United States.

出版信息

ACS Nano. 2025 Jan 14;19(1):1547-1556. doi: 10.1021/acsnano.4c14556. Epub 2025 Jan 1.

Abstract

Plasmonic semiconductors exhibit significant potential for harvesting near-IR solar energy, although their mechanisms of plasmon-induced hot electron transfer (HET) are poorly understood. We report a transient absorption study of plasmon-induced HET in p-CuS/CdS type II heterojunctions. Near-IR excitation of the p-CuS plasmon band at ∼1400 nm leads to ultrafast HET into the CdS conduction band with a time constant of <150 fs and a quantum efficiency of ∼0.054%. The injected hot electrons remain in CdS with an amplitude-weighted average lifetime of 1.9 ± 0.5 ns, significantly longer than that in Au/CdS heterostructures, suggesting that plasmonic semiconductors can slow down charge recombination due to the presence of a bandgap. The excited near-IR plasmon does not decay by coupling to the interfacial charge transfer transition, likely due to its energy mismatch. This study provides a detailed mechanistic understanding and possible directions for improving plasmonic HET in plasmonic semiconductor heterojunctions.

摘要

等离子体半导体在收集近红外太阳能方面展现出巨大潜力,尽管其等离子体诱导热电子转移(HET)机制尚不清楚。我们报道了对p-CuS/CdS II型异质结中等离子体诱导HET的瞬态吸收研究。在约1400 nm处对p-CuS等离子体带进行近红外激发,导致热电子以<150 fs的时间常数和约0.054%的量子效率超快转移到CdS导带中。注入的热电子在CdS中保持的幅度加权平均寿命为1.9±0.5 ns,明显长于Au/CdS异质结构中的寿命,这表明由于带隙的存在,等离子体半导体可以减缓电荷复合。激发的近红外等离子体不会通过与界面电荷转移跃迁耦合而衰减,可能是由于能量不匹配。这项研究为理解等离子体半导体异质结中等离子体HET的详细机制以及改进方向提供了可能。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/caff/11752524/042fe9cc1b66/nn4c14556_0007.jpg

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