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二维n型二硫化钼纳米片/p型重硼掺杂金刚石异质结在高温下的光电性能

Photoelectric Performance of Two-Dimensional n-MoS Nanosheets/p-Heavily Boron-Doped Diamond Heterojunction at High Temperature.

作者信息

Shen Deyu, Li Changxing, Sang Dandan, Ge Shunhao, Wang Qinglin, Xiao Dao

机构信息

School of Physics Science and Information Technology, Liaocheng University, Liaocheng 252000, China.

出版信息

Int J Mol Sci. 2025 May 9;26(10):4551. doi: 10.3390/ijms26104551.

Abstract

Two-dimensional (2D) n-MoS nanosheets (NSs) synthesized via the sol-gel method were deposited onto p-type heavily boron-doped diamond (BDD) film to form a n-MoS/p-degenerated BDD (DBDD) heterojunction device. The PL emission results for the heterojunction suggest strong potential for applications using yellow-light-emitting optoelectronic devices. From room temperature (RT) to 180 °C, the heterojunction exhibits typical rectification characteristics with good results for thermal stability, rectification ratio, forward current decrease, and reverse current increase. Compared with the n-MoS/p-lightly B-doped (non-degenerate) diamond heterojunction, the heterojunction demonstrates a significant improvement in both its rectification ratio and ideal factor. At 100 °C, the rectification ratio reaches the maximum value and is considered an ideal high temperature for achieving optimal heterojunction performance. When the temperature exceeds 140 °C, the heterojunction transforms into the Zener diode. The heterojunction's electrical temperature dependence is due to the Fermi level shifting resulting in the weakening of the carrier interband tunneling injection. The n-MoS NSs/p-DBDD heterojunction will broaden future research application prospects in the field of high-temperature consumption in future optoelectronic devices.

摘要

通过溶胶 - 凝胶法合成的二维(2D)n型二硫化钼纳米片(NSs)沉积在p型重硼掺杂金刚石(BDD)薄膜上,形成n-MoS/p型简并BDD(DBDD)异质结器件。该异质结的光致发光发射结果表明其在使用黄光发射光电器件的应用中具有巨大潜力。从室温(RT)到180°C,该异质结呈现出典型的整流特性,在热稳定性、整流比、正向电流降低和反向电流增加方面都有良好的结果。与n-MoS/p型轻硼掺杂(非简并)金刚石异质结相比,该异质结在整流比和理想因子方面都有显著提高。在100°C时,整流比达到最大值,被认为是实现最佳异质结性能的理想高温。当温度超过140°C时,该异质结转变为齐纳二极管。该异质结的电学温度依赖性是由于费米能级移动导致载流子带间隧穿注入减弱。n-MoS NSs/p-DBDD异质结将拓宽未来光电器件高温应用领域的研究应用前景。

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