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生长反馈对适应性基因回路影响的动力学机制。

Dynamical mechanisms of growth-feedback effects on adaptive gene circuits.

作者信息

Kong Ling-Wei, Shi Wenjia, Tian Xiao-Jun, Lai Ying-Cheng

机构信息

School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, United States.

Department of Physics, Xi'an University of Technology, Xi'an, China.

出版信息

Elife. 2025 Jun 5;12:RP89170. doi: 10.7554/eLife.89170.

Abstract

The successful integration of engineered gene circuits into host cells remains a significant challenge in synthetic biology due to circuit-host interactions, such as growth feedback, where the circuit influences cell growth and vice versa. Understanding the dynamics of circuit failures and identifying topologies resilient to growth feedback are crucial for both fundamental and applied research. Utilizing transcriptional regulation circuits with adaptation as a paradigm, we systematically study more than 400 topological structures and uncover various categories of failures. Three dynamical mechanisms of circuit failures are identified: continuous deformation of the response curve, strengthened or induced oscillations, and sudden switching to coexisting attractors. Our extensive computations also uncover a scaling law between a circuit robustness measure and the strength of growth feedback. Despite the negative effects of growth feedback on the majority of circuit topologies, we identify several circuits that maintain optimal performance as designed, a feature important for applications.

摘要

由于电路与宿主之间的相互作用,如生长反馈(即电路影响细胞生长,反之亦然),将工程基因电路成功整合到宿主细胞中仍然是合成生物学中的一项重大挑战。了解电路故障的动态过程并识别对生长反馈具有弹性的拓扑结构对于基础研究和应用研究都至关重要。以具有适应性的转录调控电路为范例,我们系统地研究了400多种拓扑结构,并发现了各种故障类别。确定了电路故障的三种动力学机制:响应曲线的连续变形、强化或诱导振荡以及突然切换到共存吸引子。我们广泛的计算还揭示了电路鲁棒性度量与生长反馈强度之间的标度律。尽管生长反馈对大多数电路拓扑结构有负面影响,但我们识别出了几个按设计保持最佳性能的电路,这一特性对应用很重要。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0f12/12140628/9221ef938b15/elife-89170-fig1.jpg

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