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植入材料的表面分析。1. 牙科钛植入材料的表面成分。

The surface analysis of implant materials. 1. The surface composition of a titanium dental implant material.

作者信息

Ameen A P, Short R D, Johns R, Schwach G

机构信息

Department of Engineering Materials, University of Sheffield, United Kingdom.

出版信息

Clin Oral Implants Res. 1993 Sep;4(3):144-50. doi: 10.1034/j.1600-0501.1993.040305.x.

DOI:10.1034/j.1600-0501.1993.040305.x
PMID:8297962
Abstract

The surfaces of titanium (Ti) plates, as models for Ti implants, have been characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF SIMS). Plates were prepared with rough and smooth surface topographies--the rough being similar to that of an implant. The XPS data has been used to construct a model of the plates' surface chemical structure, from the gas-solid interface through to pure Ti metal. At the surface of as-received plates, which underwent the same preparative procedure as an implant, considerable surface contamination was detected. In particular, high levels of carbon (C) contaminants were detected; the nature of this C was elucidated by fitting the C 1s core line and from the secondary ion mass spectra. The oxygen (O) 1s core line could not be fitted using a minimum of 2 gaussian peaks, demonstrating the multiplicity of O environments. The detection of other elements in the XPS analysis further demonstrated that, in nominally pure Ti plates, the surface chemical composition deviates considerably from that of the bulk. The data obtained from the plates were confirmed by examination of a Ti abutment. The handling of Ti plates with stainless steel tweezers was investigated. No obvious change in surface chemistry was detected. All the above results bring into serious questions the validity of rigorous protocols demanded, in some techniques, in the handling and use of Ti implants.

摘要

作为钛植入物模型的钛(Ti)板表面,已通过X射线光电子能谱(XPS)和飞行时间二次离子质谱(TOF SIMS)进行了表征。制备了具有粗糙和光滑表面形貌的板材——粗糙表面类似于植入物表面。XPS数据已用于构建从气固界面到纯钛金属的板材表面化学结构模型。在经过与植入物相同制备程序的到货板材表面,检测到了相当程度的表面污染。特别是,检测到了高水平的碳(C)污染物;通过拟合C 1s核心线并从二次离子质谱中阐明了这种碳的性质。氧(O)1s核心线无法用至少2个高斯峰进行拟合,这表明存在多种氧环境。XPS分析中对其他元素的检测进一步表明,在名义上为纯钛的板材中,表面化学成分与块状材料有很大偏差。通过检查钛基台证实了从板材获得的数据。研究了用不锈钢镊子处理钛板的情况。未检测到表面化学有明显变化。上述所有结果对某些技术中对钛植入物的处理和使用所要求的严格规程的有效性提出了严重质疑。

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