Comparative study of ion milling techniques in cross-sectional transmission electron microscope specimen preparation.

Zielinski E M, Tracy B

Intel Corporation, Santa Clara, California 95052-8126.

Microsc Res Tech. 1992 Jul 1;22(2):199-206. doi: 10.1002/jemt.1070220209.

Abstract

摘要

相似文献

Microsc Res Tech. 1992 Jul 1;22(2):199-206. doi: 10.1002/jemt.1070220209.

J Electron Microsc Tech. 1991 Dec;19(4):452-60. doi: 10.1002/jemt.1060190407.

J Electron Microsc Tech. 1988 Apr;8(4):355-61. doi: 10.1002/jemt.1060080404.

J Electron Microsc (Tokyo). 2011;60(1):1-9. doi: 10.1093/jmicro/dfq066. Epub 2010 Sep 24.

Microsc Res Tech. 1997 Mar 1;36(5):362-7. doi: 10.1002/(SICI)1097-0029(19970301)36:5<362::AID-JEMT3>3.0.CO;2-N.

Microsc Res Tech. 1996 Apr 15;33(6):490-5. doi: 10.1002/(SICI)1097-0029(19960415)33:6<490::AID-JEMT3>3.0.CO;2-P.

J Electron Microsc Tech. 1991 Dec;19(4):473-85. doi: 10.1002/jemt.1060190410.

J Electron Microsc Tech. 1991 Sep;19(1):90-8. doi: 10.1002/jemt.1060190109.

J Electron Microsc Tech. 1990 Jan;14(1):79-82. doi: 10.1002/jemt.1060140112.

J Electron Microsc Tech. 1990 Aug;15(4):377-82. doi: 10.1002/jemt.1060150407.

20分钟写一篇综述，助力文献阅读效率提升50倍。

大模型驱动的PubMed中文搜索引擎

学术文献翻译模型，支持多种主流文档格式。