Shannon R V
House Ear Institute, Los Angeles, CA 90057.
IEEE Trans Biomed Eng. 1992 Apr;39(4):424-6. doi: 10.1109/10.126616.
A model is presented that represents a large body of data on safety and damage levels of electrical stimulation. The predictions of the model are consistent with known principles of current flow and known mechanisms of damage around stimulating electrodes. It is proposed that limits on levels of electrical stimulation take into account the location of the electrode relative to the stimulated tissue and these limits can be computed algorithmically from the model.
本文提出了一个模型,该模型代表了大量关于电刺激安全性和损伤程度的数据。该模型的预测与电流流动的已知原理以及刺激电极周围的损伤机制相一致。建议电刺激水平的限制应考虑电极相对于受刺激组织的位置,并且这些限制可以通过该模型以算法方式计算得出。